AVS 64th International Symposium & Exhibition
    Advanced Ion Microscopy Focus Topic Thursday Sessions
       Session HI+NS+TR-ThA

Invited Paper HI+NS+TR-ThA1
Multimodal Chemical Imaging of Nanoscale Interfacial Phenomena on a Combined HIM-SIMS Platform

Thursday, November 2, 2017, 2:20 pm, Room 7 & 8

Session: Novel Beam Induced Surface Analysis and Nano-Patterning
Presenter: Olga Ovchinnikova, Oak Ridge National Laboratory
Correspondent: Click to Email

The key to advancing energy materials is to understand and control the structure and chemistry at interfaces. However, significant gaps hamper chemical characterization available to study and fully comprehend interfaces and dynamic processes; partly due to the lack of breadth of necessary information, as well as its scattered nature among a multitude of necessary measurement platforms. Multimodal chemical imaging transcends existing analytical capabilities for nanometer scale spatially resolved interfacial studies, through a unique merger of advanced helium ion microscopy (HIM) and secondary ion mass spectrometry (SIMS) techniques. In this talk I will discuss how to visualize material transformations at interfaces, to correlate these changes with chemical composition, and to distil key performance-centric material parameters using a multimodal chemical imaging approach on a combined HIM-SIMS system. Particular attention will be focused on how to use the HIM-SIMS to study the role of ionic migration on the photovoltaic performance, or alternatively whether the ionic migration plays a positive or negative role in determining superior photovoltaic performance in organic-inorganic perovskites (HOIPs). I will discuss how synthesizing perovskite on custom substrates effect active chemical agents in materials and understand how interfaces in materials affect the local chemistry, specifically, key energy related parameters such as electron and ion motion and their re-distribution. Overall, multimodal chemical imaging on a combined HIM-SIMS platform offers the potential to unlock the mystery of active interface formation through intertwining data analytics, nanoscale elemental characterization, with imaging; to better grasp the physical properties of materials and the mechanistic physics-chemistry interplay behind their properties.

Acknowledgements

This work was conducted at the Center for Nanophase Materials Sciences, which is a Department of Energy (DOE) Office of Science User Facility