AVS 64th International Symposium & Exhibition | |
Advanced Ion Microscopy Focus Topic | Thursday Sessions |
Session HI+BI+NS+TR-ThM |
Session: | Advanced Ion Microscopy Applications |
Presenter: | Alex Belianinov, Oak Ridge National Laboratory |
Authors: | A. Belianinov, Oak Ridge National Laboratory M. Halsted, Oak Ridge National Laboratory M.J. Burch, Oak Ridge National Laboratory S. Kim, Oak Ridge National Laboratory S. Retterer, Oak Ridge National Laboratory |
Correspondent: | Click to Email |
SEM is a high-resolution imaging technique used for characterization of a broad variety of materials. However, in order to image highly insulating, soft biological materials, the samples must be coated for charge compensation. These (typically) metallic coatings create a homogenous surface and may cloak true biological behavior and material contrast in the micrograph. In the case of Geobacter sulfurreducens, metal coating precludes detailed investigation of microbial attachment, presence of EPS, and fine surface details that may elucidate the mechanisms behind architecture formation and genetic material exchange.
Recently introduced HIM, offers more flexibility in investigating biological samples, as highly insulating sample can be imaged sui generis, without the use of a conductive coating. [2] This opens new pathways to capturing high resolution spatial details of biofilm formation and biofilm properties. Furthermore, high-resolution HIM imaging reveals true surface details of Geobacter sulfurreducens, such as flagella or pilin typically inaccessible by SEM. Finally, the effects of different sample preparation strategies for SEM and HIM will be illustrated and discussed.
References:
[1] 1. Donlan, R. M. “Biofilms: Microbial Life on Surfaces.” Emerging Infectious Diseases, 8(9), 881–890, 2002
[2] Joens, M. S., Huynh, C., Kasuboski, J. M., Ferranti et. al.. “Helium Ion Microscopy (HIM) for the imaging of biological samples at sub-nanometer resolution.” Scientific Reports, 3(3514), 2013
Acknowledgements:
This research was supported by Oak Ridge National Laboratory’s Center for Nanophase Materials Sciences (CNMS), which is sponsored by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy.