| AVS 64th International Symposium & Exhibition | |
| Applied Surface Science Division | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS+BI+MI-MoM1 Obtaining Complete Characterisation of Core-shell Nanoparticle Structure and Composition via the use of Complementary Techniques David Cant, C. Minelli, National Physical Laboratory, UK, K. Sparnacci, Università degli Studi del Piemonte Orientale, Italy, W. Unger, Bundesanstalt für Materialforschung und -prüfung (BAM), Germany, A. Hermanns, Bundesanstalt für Materialforschung und -prüfung (BAM), W.S.M. Werner, H. Kalbe, TU Wien, Austria, R. Garcia-Diez, C. Gollwitzer, M. Krumrey, Physikalisch-Technische Bundesanstalt, Germany, A.G. Shard, National Physical Laboratory, UK |
| 9:00am | AS+BI+MI-MoM3 Invited Paper Correlative Microscopy based on Secondary Ion Mass Spectrometry for High-Resolution High-Sensitivity Nano-Analytics Tom Wirtz, J.-N. Audinot, D.M.F. Dowsett, S. Eswara, Luxembourg Institute of Science and Technology (LIST), Luxembourg |
| 9:40am | AS+BI+MI-MoM5 New Insights on Layered Polymer Systems, Polymer Networks and Polymerization in Defined Geometries by Combining Surface Analysis with Depth Profiling using ToF-SIMS and XPS as Analytical Tools Sven Steinmüller, Institute for Applied Materials, Karlsruhe Institute of Technology, Germany, A. Llevot, Institute of Organic Chemistry, Karlsruhe Institute of Technology, Germany, D. Moock, Institute for Applied Materials, Karlsruhe Institute of Technology, Germany, B. Bitterer, Institute of Organic Chemistry, Karlsruhe Institute of Technology, Germany, F. Cavalli, Institute for Biological Interfaces, Karlsruhe Institute of Technology, Germany, S. Hurrle, Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute of Technology, Germany, M. Bruns, Institute for Applied Materials, Karlsruhe Institute of Technology, Germany |
| 10:00am | AS+BI+MI-MoM6 Combining Monoatomic- and Cluster Ion Sputtering in ToF-SIMS and XPS Depth Profiling of Organic-inorganic Multilayer Structures Eric Langer, J.-P. Barnes, O.J. Renault, T. Maindron, CEA-Leti, France, L. Houssiau, University of Namur, Belgium |
| 10:40am | AS+BI+MI-MoM8 Ultra High Surface Sensitivity – Elemental Analysis of the Outer Layer Thomas Grehl, P. Brüner, H.H. Brongersma, ION-TOF GmbH, Germany |
| 11:00am | AS+BI+MI-MoM9 Towards Predictive Understanding of Li-S Battery Materials through Multimodal Analysis Vijayakumar Murugesan, K. Han, M.I. Nandasiri, V. Shutthanandan, S. Thevuthasan, K.T. Mueller, Pacific Northwest National Laboratory |
| 11:20am | AS+BI+MI-MoM10 Combined use of Back Side SIMS and FIB Sample Preparation Mikhail Klimov, University of Central Florida |
| 11:40am | AS+BI+MI-MoM11 Phase Quantification of Mixed TiO2 Powders by X-ray Photoemission Valence Band Analysis and Raman Spectroscopy Paul Mack, T.S. Nunney, Thermo Fisher Scientific, UK, R.G. Palgrave, University College London, United Kingdom of Great Britain and Northern Ireland |