AVS 64th International Symposium & Exhibition | |
Thin Films Division | Monday Sessions |
Session TF-MoA |
Session: | Emerging Applications for ALD |
Presenter: | Alexander Kozen, U.S. Naval Research Laboratory |
Authors: | A.C. Kozen, U.S. Naval Research Laboratory M. Currie, U.S. Naval Research Laboratory B.P. Downey, U.S. Naval Research Laboratory C.R. Eddy, Jr., U.S. Naval Research Laboratory V.D. Wheeler, U.S. Naval Research Laboratory |
Correspondent: | Click to Email |
Vanadium Dioxide (VO2) is a thermochromic material that undergoes a first order crystalline phase transition at a critical temperature (Tc) of 68˚C. This structural phase transition is accompanied by major changes in electrical and optical properties, particularly in the infrared. As such, VO2 is suitable for many applications including microbolometers, adaptive thermal coatings, and passive spacecraft thermal shielding.
While the Tc of VO2 is appropriate for many current applications, it is desirable to modify the Tc to other values for improved performance of current applications or to address new emerging application needs. The Tc of VO2 has been shifted by doping with other transition metals on the order of 1-5%.[1], [2], however these doped VO2 films were deposited by PLD, MBE, and sputtering, all line of sight physical vapor deposition techniques.
We demonstrate digital doping of ALD Nb:VO2 by incorporation of ALD Nb2O5 (TBTDEN + O3) into the conventional ALD VO2 process (TEMAV + O3). Inclusion of Nb into the ALD VO2 process in amounts between 1% and 5% makes minimal impact on as-deposited film morphology. After annealing, the Nb:VO2 films also exhibit minimal physical changes from their undoped analogues. We find that Nb doping can lower the Tc of the VO2 films by -13.5˚C/Nb% while maintaining acceptable optical modulation behavior, critical for use of doped VO2 in emerging applications.
[1] W. Burkhardt, T. Christmann, B. K. Meyer, and W. Niessner, “W-and F-doped VO 2 films studied by photoelectron spectrometry,” Thin Solid Films, vol. 345, no. 2, pp. 229–235, 1999.
[2] X. Wu, Z. Wu, C. Ji, H. Zhang, Y. Su, Z. Huang, J. Gou, X. Wei, J. Wang, and Y. Jiang, “THz Transmittance and Electrical Properties Tuning across IMT in Vanadium Dioxide Films by Al Doping,” ACS Appl. Mater. Interfaces, vol. 8, no. 18, pp. 11842–11850, May 2016.