AVS 62nd International Symposium & Exhibition | |
Electronic Materials and Processing | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
EM-TuP1 Ionic Liquid Gated Electric Double Layer Transistors based on a-IGZO Thin Films PushpaRaj Pudasaini, J.H. Noh, A. Wong, A.V. Haglund, The University of Tennessee Knoxville, S. Dai, T.Z. Ward, Oak Ridge National Laboratory, D. Mandrus, University of Tennessee, Knoxville and Oak Ridge National Laboratory, P.D. Rack, The University of Tennessee Knoxville |
EM-TuP2 Resistor Thermal Noise Rectification for Energy Harvesting Amina Belkadi, S. Joshi, University of Colorado at Boulder, G. Moddel, University of Colorado at Boulder and Redwave Energy |
EM-TuP5 Electrical and Optical Properties of the Porous Nickel Oxide Thin Film as Counter Electrode for the Application to Electrochromic Devices WonChang Lee, J.U. Wie, E.C. Choi, B.Y. Hong, Sungkyunkwan University, Republic of Korea |
EM-TuP6 Tunable Optical Extinction of E-Beam Fabricated Nano-Rectennas Modified by Atomic-Layer Deposition Raymond Wambold, The Pennsylvania State University, G.J. Weisel, D.T. Zimmerman, The Pennsylvania State University, Altoona, J. Qi, B.G. Willis, University of Connecticut |
EM-TuP7 The Study of Light Control using Nanoantenna JeongHee Shin, S. Kim, J.E. Jang, Daegu Gyeongbuk Institute of Science and Technology (DGIST), Republic of Korea |
EM-TuP8 MIM: Role of Design and Fabrication Aparajita Singh, S. Bhansali, Florida International University |
EM-TuP9 Comparison of Hafnium Oxide and Zirconium Oxide Thin Films for Fabricating Electronic Devices Jouantrey Spence, F. Cunningham, R. Moten, Z. Xiao, Alabama A&M University |
EM-TuP10 Non-Equilibrium First-Principles Study on Electron Scattering Processes in Magnetic Tunnel Junction Masaaki Araidai, Nagoya University, Japan, T. Yamamoto, Tokyo University of Science, Japan, K. Shiraishi, Nagoya University, Japan |
EM-TuP11 First Principles Study on Switching Mechanism of Superlattice (GeTe)2/Sb2Te3 Phase Change Memory Masayuki Takato, H. Shirakawa, M. Araidai, K. Shiraishi, Graduate School of Engineering, Nagoya University, Japan |
EM-TuP12 First Principles Study on Atomic-scale Behavior of N, H Atoms and O Vacancy Related Defects in SiO2 Layer of MONOS Memories Hiroki Shirakawa, Graduate School of Engineering Nagoya University, Japan, M. Araidai, Graduate School of Engineering, Nagoya University, Japan, K. Kamiya, Center for Basic Education and Integrated Learning, Kanagawa Institute of Technology, Japan, K. Shiraishi, Graduate School of Engineering, Nagoya University, Japan |
EM-TuP14 Hybridization and Characterization of Reduced Graphene Oxide with Copper Nanoparticles J.D. Lee, L.R. Hubbard, Anthony Muscat, University of Arizona |
EM-TuP15 Hybrid Transparent Conductive Electrodes Embedded with Pt Nanoclusters for Reliable and Efficient GaN-based Light-Emitting Diodes K. Kim, Hyunsoo Kim, Chonbuk National University, Republic of Korea |
EM-TuP16 Selective Area Growth of InN on Patterned Substrate by Plasma-Assisted Metal-Organic Molecular Beam Epitaxy Wei-Chun Chen, National Applied Research Laboratories, Taiwan, Republic of China, S.Y. Kuo, Chang Gung University, Taiwan, Republic of China, F.I. Lai, Yuan-Ze University, Taiwan, Republic of China, Y.C. Lee, Chung Yuan Christian University, Taiwan, Republic of China, C.N. Hsiao, National Applied Research Laboratories, Taiwan, Republic of China |
EM-TuP17 N+-InGaP or N+-GaAs NanoWires for JunctionLess Transistors Fabricated by Focused Ion Beam (FIB) System Cássio Almeida, L.P.B. Lima, UNICAMP, Brazil, H.T. Obata, M. Cotta, University of Campinas, Brazil, J.A. Diniz, UNICAMP, Brazil |
EM-TuP18 Thermoelectric Figure of Merit of E-Beam-Grown Nanoscale Multilayered Bi2Te3/Sb2Te3 Thin Films Zhigang Xiao, S. Budak, Alabama A&M University |
EM-TuP21 Band-Gap Measurements of Low-K Porous Organosilicate Dielectrics using Vacuum Ultraviolet Irradiation H. Zheng, Joshua Blatz, University of Wisconsin-Madison, S.W. King, Intel Corporation, E. Ryan, GLOBALFOUNDRIES, Y. Nishi, Stanford University, J.L. Shohet, University of Wisconsin-Madison |
EM-TuP22 VUV Curing Process for Low-k Organosilicate Dielectrics Huifeng Zheng, X. Guo, University of Wisconsin-Madison, S.W. King, Intel Corporation, E. Ryan, GLOBALFOUNDRIES, Y. Nishi, Stanford University, J.L. Shohet, University of Wisconsin-Madison |
EM-TuP26 Identification of Topological Surface States in (Bi1-xSbx)2Te3 Thin Films Jenna Walrath, A.S. Chang, V.A. Stoica, Y.H. Lin, W. Liu, L. Endicott, C. Uher, R. Clarke, University of Michigan, R.S. Goldman, University of Michigan, Ann Arbor |
EM-TuP27 Quantitative Potential Profiling Across Metal-Oxide-Semiconductor Stacks Sylvie Rangan, M. Kalyanikar, J. Duan, G. Liu, R.A. Bartynski, E. Andrei, L. Feldman, E. Garfunkel, Rutgers, the State University of New Jersey |