AVS 62nd International Symposium & Exhibition
    Electronic Materials and Processing Tuesday Sessions

Session EM-TuP
Electronic Materials and Processing Poster Session

Tuesday, October 20, 2015, 6:30 pm, Room Hall 3


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

EM-TuP1
Ionic Liquid Gated Electric Double Layer Transistors based on a-IGZO Thin Films
PushpaRaj Pudasaini, J.H. Noh, A. Wong, A.V. Haglund, The University of Tennessee Knoxville, S. Dai, T.Z. Ward, Oak Ridge National Laboratory, D. Mandrus, University of Tennessee, Knoxville and Oak Ridge National Laboratory, P.D. Rack, The University of Tennessee Knoxville
EM-TuP2
Resistor Thermal Noise Rectification for Energy Harvesting
Amina Belkadi, S. Joshi, University of Colorado at Boulder, G. Moddel, University of Colorado at Boulder and Redwave Energy
EM-TuP5
Electrical and Optical Properties of the Porous Nickel Oxide Thin Film as Counter Electrode for the Application to Electrochromic Devices
WonChang Lee, J.U. Wie, E.C. Choi, B.Y. Hong, Sungkyunkwan University, Republic of Korea
EM-TuP6
Tunable Optical Extinction of E-Beam Fabricated Nano-Rectennas Modified by Atomic-Layer Deposition
Raymond Wambold, The Pennsylvania State University, G.J. Weisel, D.T. Zimmerman, The Pennsylvania State University, Altoona, J. Qi, B.G. Willis, University of Connecticut
EM-TuP7
The Study of Light Control using Nanoantenna
JeongHee Shin, S. Kim, J.E. Jang, Daegu Gyeongbuk Institute of Science and Technology (DGIST), Republic of Korea
EM-TuP8
MIM: Role of Design and Fabrication
Aparajita Singh, S. Bhansali, Florida International University
EM-TuP9
Comparison of Hafnium Oxide and Zirconium Oxide Thin Films for Fabricating Electronic Devices
Jouantrey Spence, F. Cunningham, R. Moten, Z. Xiao, Alabama A&M University
EM-TuP10
Non-Equilibrium First-Principles Study on Electron Scattering Processes in Magnetic Tunnel Junction
Masaaki Araidai, Nagoya University, Japan, T. Yamamoto, Tokyo University of Science, Japan, K. Shiraishi, Nagoya University, Japan
EM-TuP11
First Principles Study on Switching Mechanism of Superlattice (GeTe)2/Sb2Te3 Phase Change Memory
Masayuki Takato, H. Shirakawa, M. Araidai, K. Shiraishi, Graduate School of Engineering, Nagoya University, Japan
EM-TuP12
First Principles Study on Atomic-scale Behavior of N, H Atoms and O Vacancy Related Defects in SiO2 Layer of MONOS Memories
Hiroki Shirakawa, Graduate School of Engineering Nagoya University, Japan, M. Araidai, Graduate School of Engineering, Nagoya University, Japan, K. Kamiya, Center for Basic Education and Integrated Learning, Kanagawa Institute of Technology, Japan, K. Shiraishi, Graduate School of Engineering, Nagoya University, Japan
EM-TuP14
Hybridization and Characterization of Reduced Graphene Oxide with Copper Nanoparticles
J.D. Lee, L.R. Hubbard, Anthony Muscat, University of Arizona
EM-TuP15
Hybrid Transparent Conductive Electrodes Embedded with Pt Nanoclusters for Reliable and Efficient GaN-based Light-Emitting Diodes
K. Kim, Hyunsoo Kim, Chonbuk National University, Republic of Korea
EM-TuP16
Selective Area Growth of InN on Patterned Substrate by Plasma-Assisted Metal-Organic Molecular Beam Epitaxy
Wei-Chun Chen, National Applied Research Laboratories, Taiwan, Republic of China, S.Y. Kuo, Chang Gung University, Taiwan, Republic of China, F.I. Lai, Yuan-Ze University, Taiwan, Republic of China, Y.C. Lee, Chung Yuan Christian University, Taiwan, Republic of China, C.N. Hsiao, National Applied Research Laboratories, Taiwan, Republic of China
EM-TuP17
N+-InGaP or N+-GaAs NanoWires for JunctionLess Transistors Fabricated by Focused Ion Beam (FIB) System
Cássio Almeida, L.P.B. Lima, UNICAMP, Brazil, H.T. Obata, M. Cotta, University of Campinas, Brazil, J.A. Diniz, UNICAMP, Brazil
EM-TuP18
Thermoelectric Figure of Merit of E-Beam-Grown Nanoscale Multilayered Bi2Te3/Sb2Te3 Thin Films
Zhigang Xiao, S. Budak, Alabama A&M University
EM-TuP21
Band-Gap Measurements of Low-K Porous Organosilicate Dielectrics using Vacuum Ultraviolet Irradiation
H. Zheng, Joshua Blatz, University of Wisconsin-Madison, S.W. King, Intel Corporation, E. Ryan, GLOBALFOUNDRIES, Y. Nishi, Stanford University, J.L. Shohet, University of Wisconsin-Madison
EM-TuP22
VUV Curing Process for Low-k Organosilicate Dielectrics
Huifeng Zheng, X. Guo, University of Wisconsin-Madison, S.W. King, Intel Corporation, E. Ryan, GLOBALFOUNDRIES, Y. Nishi, Stanford University, J.L. Shohet, University of Wisconsin-Madison
EM-TuP26
Identification of Topological Surface States in (Bi1-xSbx)2Te3 Thin Films
Jenna Walrath, A.S. Chang, V.A. Stoica, Y.H. Lin, W. Liu, L. Endicott, C. Uher, R. Clarke, University of Michigan, R.S. Goldman, University of Michigan, Ann Arbor
EM-TuP27
Quantitative Potential Profiling Across Metal-Oxide-Semiconductor Stacks
Sylvie Rangan, M. Kalyanikar, J. Duan, G. Liu, R.A. Bartynski, E. Andrei, L. Feldman, E. Garfunkel, Rutgers, the State University of New Jersey