| AVS 61st International Symposium & Exhibition | |
| Scanning Probe Microscopy Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | SP+AS+BI+NS+SS-WeA1 Invited Paper Majorana Mode in Vortex core of Bi2Te3/NbSe2Topological Insulator-Superconductor Heterostructure Jinfeng Jia, Shanghai Jiao Tong University, China |
| 3:00pm | SP+AS+BI+NS+SS-WeA3 Robust Protection from Backscattering in the Topological Insulator Bi1.5Sb0.5Te1.7Se1.3 Fumio Komori, S. Kim, S. Yoshizawa, Y. Ishida, University of Tokyo, Japan, K. Eto, K. Segawa, Osaka University, Japan, S. Shin, University of Tokyo, Japan, Y. Ando, Osaka University, Japan |
| 3:20pm | SP+AS+BI+NS+SS-WeA4 Measurements and Analysis of Sub Nanometer Stepped Surfaces Using a Traceable Atomic Force Microscope Ndubuisi Orji, National Institute of Standards and Technology (NIST), S. Gonda, AIST, Japan, R.G. Dixson, National Institute of Standards and Technology (NIST) |
| 4:20pm | SP+AS+BI+NS+SS-WeA7 Invited Paper Direct Observation of Edge States of 1D and 2D Topological insulators Han Woong Yeom, Institute for Basic Science, Republic of Korea |
| 5:00pm | SP+AS+BI+NS+SS-WeA9 Controlling Charges of the Dipole Layer at Metal-Semiconductor Interfaces Tae-Hwan Kim, Pohang University of Science and Technology, Republic of Korea, H.W. Yeom, Pohang University of Science and Technology and Institute for Basic Science, Republic of Korea |
| 5:20pm | SP+AS+BI+NS+SS-WeA10 Advances in Imaging and Quantification of Electrical Properties at the Nanoscale using Scanning Microwave Impedance Microscopy (sMIM) Stuart Friedman, Y. Yang, O. Amster, PrimeNano, Inc, S. Johnston, Stanford University |
| 5:40pm | SP+AS+BI+NS+SS-WeA11 Scanning Photocurrent Microscopy on MoS2, MoS2(1-x)Se2x, and MoSe2 Monolayer Islands and Films Grown by CVD Velveth Klee, D. Barroso, E. Preciado, University of California - Riverside, K. Erickson, Sandia National Laboratories, M. Triplett, University of California -Davis, C. Lee, A. Nguyen, I. Lu, S. Bobek, J. Mann, University of California - Riverside, A. Talin, F. Leonard, Sandia National Laboratories, L. Bartels, University of California - Riverside |