| AVS 61st International Symposium & Exhibition | |
| Scanning Probe Microscopy Focus Topic | Wednesday Sessions |
| Session SP+AS+BI+NS+SS-WeA |
| Session: | Advances in Scanning Probe Microscopy |
| Presenter: | Velveth Klee, University of California - Riverside |
| Authors: | V. Klee, University of California - Riverside D. Barroso, University of California - Riverside E. Preciado, University of California - Riverside K. Erickson, Sandia National Laboratories M. Triplett, University of California -Davis C. Lee, University of California - Riverside A. Nguyen, University of California - Riverside I. Lu, University of California - Riverside S. Bobek, University of California - Riverside J. Mann, University of California - Riverside A. Talin, Sandia National Laboratories F. Leonard, Sandia National Laboratories L. Bartels, University of California - Riverside |
| Correspondent: | Click to Email |
We presents scanning photocurrent measurements on CVD-grown monolayer films of molybdenum disulfide, molybdenum diselenide and the alloys of these materials. Our experiments reveal a pronounced effect of the current on excitation in the gap region between contacts, as opposed to directly at the electrodes. Measurements at different irradiation intensity, irradiation position and bias shed light on the charge transfer processes in this material system. Thermal effects are ruled out by complementary measurements of thermal transport using infrared imaging.