| 8:00am |
EL+AS+EM+EN+SS-ThM1 Invited Paper
Spectroscopic Ellipsometry Characterization in the Photovoltaic Device Configuration
Nikolas Podraza, University of Toledo |
| 8:40am |
EL+AS+EM+EN+SS-ThM3
Application of Pseudo-Bulk Approach in Ellipsometric Studies of Polycrystalline Photovoltaic Thin Films
Sukgeun Choi, National Renewable Energy Laboratory, J. Li, University of Toledo, I. Repins, National Renewable Energy Laboratory |
| 9:00am |
EL+AS+EM+EN+SS-ThM4
Real-Time and Through-the-Glass Mapping Spectroscopic Ellipsometry for Analysis and Optimization of CdS:O Window Layers of CdTe Superstrate Solar Cells
Xinxuan Tan, R.W. Collins, P. Koirala, J. Li, N.J. Podraza, University of Toledo |
| 9:20am |
EL+AS+EM+EN+SS-ThM5
Combined Optical Emission Spectroscopy and Spectroscopic Ellipsometry Collected During Thin Film Deposition
Anna Barnes, M.M. Junda, N.J. Podraza, University of Toledo |
| 9:40am |
EL+AS+EM+EN+SS-ThM6
Optical Insights into Graphene Functionalized by Atoms, Biomolecules and Metal Nanoparticles
Maria Losurdo, M. Giangregorio, G.V. Bianco, P. Capezzuto, G. Bruno, CNR-IMIP, Italy |
| 11:00am |
EL+AS+EM+EN+SS-ThM10
Enhanced Sensitivity to Surface-Normal Dielectric Function of Uniaxial-Anisotropic Materials via Attenuated Total Reflection Ellipsometry
Thomas Tiwald, J.A. Woollam Co., Inc., J. VanDerslice, Z. Xiao, J.S. Huang, University of Nebraska Lincoln |
| 11:20am |
EL+AS+EM+EN+SS-ThM11
Infrared to Ultraviolet Optical Properties of Gadolinium Gallium Garnet (Gd3Ga5O12) and Bismuth Germanate (Bi4Ge3O12) Single Crystals
Kiran Ghimire, H. Haneef, N.J. Podraza, University of Toledo |
| 11:40am |
EL+AS+EM+EN+SS-ThM12
Cu surface reactions in hydrochloric solution probed on the atomic scale by polarization optical methods and STM
Christoph Cobet, Gh. Barati, V. Solokha, K. Hingerl, Johannes Kepler University, Austria |