| AVS 61st International Symposium & Exhibition | |
| Applied Surface Science | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| AS-ThP1 Formation of Pt, Rh, and Pd Nanoclusters on a Graphene Moire Pattern on Cu(111) Esin Soy, Z. Liang, M. Trenary, University of Illinois at Chicago |
| AS-ThP2 Valence Band Offsets of Two Rare Earth Oxides on AlxGa1-xN (0≤x≤0.67) as Measured by Photoelectron Spectroscopy Michael Brumbach, A. Allerman, D. Wheeler, S. Atcitty, J. Ihlefeld, Sandia National Laboratories |
| AS-ThP3 Surface Electronics of Individual Si-doped GaN Wires Studied by Synchrotron-Radiation XPEEM Spectromicroscopy Olivier Renault, N. Chevalier, J.W. Morin, CEA-LETI, France |
| AS-ThP6 Characterization of Nanostructured Cu-Zn Oxides Used for Photocathodic Water Splitting Sankar Raman, J.F. Moulder, Physical Electronics Inc., S. Banarjee, Washington University, St. Louis, Y. Myung, H. Im, J. Park, Korea University, P. Banarjee, Washington University, St. Louis |
| AS-ThP8 Impact of a Mixed Oxide’s Surface Composition and Structure on Its Adsorptive Properties: The Case of the α-(Fe,Cr)2O3(0001) Surface M.A. Henderson, Mark Engelhard, Pacific Northwest National Laboratory |
| AS-ThP9 Analysis of Metal Particles by Proximal Excitation of Al and Mgkα X-rays C.F. Mallinson, James Castle, University of Surrey, UK |
| AS-ThP10 XPS Sputter Depth Profiling of Organometallic Multilayer Materials Using Massive Argon Cluster Ions Simon Hutton, Kratos Analytical Limited, UK, T. Bendikov, Weizmann Institute of Science, Israel, W. Boxford, SC. Page, J.D.P. Counsell, Kratos Analytical Limited, UK |
| AS-ThP11 XPS of Liquids: Chemical Bonding in Ionic Liquids and on Tribo-Films Formed on Cast Iron Harry Meyer, J. Qu, H. Luo, W. Barnhill, Oak Ridge National Laboratory |
| AS-ThP12 X-ray Photoelectron Spectroscopy for Electronic Structure and Valence Information R.G. White, Thermo Fisher Scientific, UK, Thomas Levesque, Thermo Fisher Scientific |
| AS-ThP13 Mapping Chemical and Mechanical Property Degradation in PV Modules Katherine Stika, C.S. Westphal, DuPont Central Research and Development, J. Kapur, DuPont Packaging & Industrial Polymers, R.G. Raty, J. Li, DuPont Central Research and Development, J. Kopchick, W. Gambogi, B. Hamzavytehrany, A. Bradley, DuPont Photovoltaic Solutions, J.R. Marsh, B. Foltz, DuPont Central Research and Development |
| AS-ThP14 Surface and Interface Studies of Flexible Front Sheets for PV Modules Lei Zhang, N.J. Glassmaker, B.B. Sauer, DuPont Central Research and Development |
| AS-ThP15 Multi-technique Surface Analysis of Catalytic Systems with XPS, ISS and UPS Bill Sgammato, Thermo Fisher Scientific, UK |
| AS-ThP16 Multifunctional Ultra-High Vacuum Apparatus for Studies of the Interactions of Chemical Warfare Agents on Complex Surfaces Wesley Gordon, U. S. Army Edgewood Chemical Biological Center, E.M. Durke, Excet, Inc., A.R. Wilmsmeyer, Augustana College, J.R. Morris, Virginia Tech |
| AS-ThP17 A New Transfer Vessel to Facillitate the Characterization of Air-Sensitive Materials Richard White, T.S. Nunney, Thermo Fisher Scientific, UK, H.M. Meyer, Oak Ridge National Laboratory |
| AS-ThP18 Large-Area Secondary Ion Mapping: An Essential Component of Industrial Problem-Solving Kathryn Lloyd, J.R. Marsh, DuPont Corporate Center for Analytical Sciences |
| AS-ThP19 In Situ Ar Plasma Cleaning of Samples Prior to Surface Analysis Vincent Smentkowski, H. Piao, General Electric Global Research Center, C.A. Moore, XEI Scientific |
| AS-ThP20 Discrete Distribution Profile Model for Characterization of Ultra-Thin Surface Films Tatyana Bendikov, T. Toledano, H. Cohen, Weizmann Institute of Science, Israel |
| AS-ThP24 Co-solvent Enhanced Zinc Oxysulfide Buffer Layers in Kesterite Cu2ZnSnSe4 Solar Cells Xerxes Steirer, R.L. Garris, J. Li, National Renewable Energy Laboratory, M. Dzara, Rochester Institute of Technology, P.F. Ndione, K. Ramanathan, I. Repins, G. Teeter, C.L. Perkins, National Renewable Energy Laboratory |
| AS-ThP25 Analysis of Metal Nanoparticles by Auger, XPS and TEM Wayne Jennings, Case Western Reserve University, C.V. Bishop, The Best Mode Company, J. Cowen, Case Western Reserve University, J.S. Hammond, D.F. Paul, Physical Electronics USA |