| AVS 61st International Symposium & Exhibition | |
| Atom Probe Tomography Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | AP+AS+MC+NS+SS-ThM1 Invited Paper A Vision for Atom Probe Tomography Thomas F. Kelly, CAMECA Instruments Inc |
| 8:40am | AP+AS+MC+NS+SS-ThM3 Invited Paper Interfaces in Semiconductors: Application to Photovoltaic Materials Oana Cojocaru-Mirédin, Max Planck Institut fur Eisenforschung GmbH, Germany, R. Würz, Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg, Germany, D. Raabe, Max Planck Institut fur Eisenforschung GmbH, Germany |
| 9:20am | AP+AS+MC+NS+SS-ThM5 Analysis of Discontinuous InGaN Quantum Wells by Correlated Atom Probe Tomography, Micro-Photoluminescence, and X-ray Diffraction J. Riley, X. Ren, Northwestern University, D. Koleske, Sandia National Laboratories, Lincoln Lauhon, Northwestern University |
| 9:40am | AP+AS+MC+NS+SS-ThM6 Atom Probe Tomography Characterization of Doped Epitaxial Oxide Multi-Layered Structures Nitesh Madaan, A. Devaraj, Z. Xu, M.I. Nandasiri, S.A. Thevuthasan, Pacific Northwest National Laboratory |
| 11:00am | AP+AS+MC+NS+SS-ThM10 Invited Paper Atom Probe Tomography and Field Evaporation of Insulators and Semiconductors: Theoretical Issues Hans Kreuzer, Dalhousie University, Canada |
| 11:40am | AP+AS+MC+NS+SS-ThM12 Atom Probe Tomography Investigation of the Microstructure of Multistage Annealed Nanocrystalline SmCo2Fe2B Alloy with Enhanced Magnetic Properties Xiujuan Jiang, A. Devaraj, Pacific Northwest National Laboratory, B. Balamurugan, University of Nebraska-Lincoln, J. Cui, Pacific Northwest National Laboratory, J. Shield, University of Nebraska-Lincoln |
| 12:00pm | AP+AS+MC+NS+SS-ThM13 Detector Dead-time Effects on the Accurate Measurement of Boron in Atom Probe Tomography Frederick Meisenkothen, National Institute of Standards and Technology (NIST), T.J. Prosa, CAMECA Instruments Inc., E.B. Steel, NIST, R.P. Kolli, University of Maryland, College Park |