| AVS 61st International Symposium & Exhibition | |
| Atom Probe Tomography Focus Topic | Thursday Sessions |
| Session AP+AS+MC+NS+SS-ThM |
| Session: | APT Analysis of Semiconductors, Magnetic and Oxide Materials |
| Presenter: | Thomas F. Kelly, CAMECA Instruments Inc |
| Correspondent: | Click to Email |
Atom Probe Tomography has undergone revolutionary changes in the past two decades. It is tempting to think that these changes are likely to be followed by a period of adjustment and maturation but not continued innovation. However, there are still many active opportunities for development of atom probe tomography. Some of these new technologies are already upon us. There are recent major developments in data reconstruction, detector technology, data mining, and correlative microscopy. Furthermore, application areas are evolving at a rapid pace. The equipment needed to serve some applications will necessarily be developing alongside the more fundamental operating components of atom probes.
This talk with review some recent developments that are just emerging and will offer a vision for where the field is headed. Some of the unproven concepts needed to reach this vision will be highlighted.