AVS 58th Annual International Symposium and Exhibition
    Nanomanufacturing Science and Technology Focus Topic Wednesday Sessions

Session NM+AS+MS-WeM
Nanomanufacturing Issues: Metrology and Environmental Concerns

Wednesday, November 2, 2011, 8:00 am, Room 111
Moderators: Jackie Johnson, University of Tennessee Space Institute, Warren Collins, Fisk University


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

9:00am NM+AS+MS-WeM4
Particle Characterization Issues in Evaluating the Toxicity and Environmental Impact of Manufactured Nanomaterials
Kevin Powers, University of Florida
9:40am NM+AS+MS-WeM6
Sampling for Airborne Nanoparticles and Selecting Respiratory Protection
Steve Hays, Gobbell Hays Partners, Inc., J.R. Millette, MVA Scientific Consultants
10:40am NM+AS+MS-WeM9 Invited Paper
Local Probes Enabling Science and Manufacturing
Dawn Bonnell, University of Pennsylvania
11:20am NM+AS+MS-WeM11
The Influence of Surrounding Materials on the Optical Properties of Nanoscale Films: An Unforeseen Complication in Nanoscale Metrology
Alain Diebold, V.K. Kamineni, University at Albany