| AVS 58th Annual International Symposium and Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| EL-ThP1 Microstructure and Dispersive Optical Parameters of Tungsten, Titanium and Tungsten-Titanium Films Victor Atuchin, T.I. Grigorieva, A.S. Kozhukhov, V.N. Kruchinin, L.D. Pokrovsky, Institute of Semiconductor Physics, Russian Federation, R.S. Vemuri, Pacific Northwest National Laboratory, C.V. Ramana, University of Texas at El Paso |
| EL-ThP2 Temperature Dependences of the Dielectric Response of InSb Measured by Spectroscopic Ellipsometry JaeJin Yoon, T.J. Kim, S.Y. Hwang, M.S. Diware, Y.D. Kim, Kyung Hee University, Republic of Korea, Y.C. Chang, Academia Sinica, Taiwan, Republic of China |
| EL-ThP3 Tailored Helical Nanostructures Investigated with Mueller Matrix Ellipsometry Roger Magnusson, J. Birch, C.-L. Hsaio, P. Sandström, H. Arwin, K. Järrendahl, Linköping University, Sweden |
| EL-ThP4 Study of the Thin Film Growth of Volatile Condensable Material via In Situ Ellipsometry and Quartz Crystal Microbalance Measurements Jinya Pu, F. Zhou, N.J. Ianno, The University of Nebraska |
| EL-ThP5 Combined Electrochemical Impedance Spectroscopy and In Situ Spectroscopic Ellipsometry of Anodically Grown SiO2 E.A. Montgomery, University of Nebraska - Lincoln, T.E. Tiwald, J.A. Woollam Co., Inc., E. Schubert, M. Schubert, University of Nebraska - Lincoln, C. Beasley, Gamry Instruments, Chad Briley, University of Nebraska - Lincoln |
| EL-ThP7 In Situ Spectroscopic Ellipsometry of Nanoscale Germanium Films Deposited via High Power Impulse Magnetron Sputtering Neil Murphy, Air Force Research Laboratory, L. Sun, Air Force Research Laboratory and General Dynamics Information Technology, A. Waite, Air Force Research Laboratory and Universal Technology Corporation, J. Jones, R. Jakubiak, Air Force Research Laboratory |