AVS 58th Annual International Symposium and Exhibition
    Spectroscopic Ellipsometry Focus Topic Thursday Sessions
       Session EL+AS+EM+MS+PS+TF-ThA

Paper EL+AS+EM+MS+PS+TF-ThA6
Bulk Hetrojunction Solar Cell Characterization by Phase Modulated Spectroscopic Ellipsometry

Thursday, November 3, 2011, 3:40 pm, Room 209

Session: Spectroscopic Ellipsometry for Photovoltaics, Metals and Oxide Thin Films
Presenter: Kishore Uppireddi, HORIBA Scientific
Authors: K. Uppireddi, HORIBA Scientific
L. Yan, HORIBA Scientific
Correspondent: Click to Email
The blend morphology, phase separation as well as crystallinity of organic photovoltaic solar cell are important properties to increase the efficiency. The performance of such cells is strongly influenced by blend composition and thermal annealing conditions. In this work we demonstrate the use of ellipsometry as a powerful and sensitive metrology means of monitoring organic solar cell based on the blend of poly(3-hexylthiophene) (P3HT) and [6,6]-phenyl C61-buytric acid methyl ester (PCBM). Ellipsometric measurements were performed on P3HT/c-Si, PCBM/c-Si and P3HT:PCBM/c-Si at an angle of incidence of 70 degree, across the spectral range 190 – 2100 nm (0.6-6.5 eV). Two different analysis protocols were used to model the P3HT:PCBM blend structure. In the first protocol effective medium theory was used to represent the optical constant of layer, where as in the second one the blend was treated as one single homogenous material. The approach renders investigation of final morphology and composition.