AVS 56th International Symposium & Exhibition
    Thin Film Friday Sessions

Session TF-FrM
Transparent Electronic Materials and Applications

Friday, November 13, 2009, 8:20 am, Room B4
Moderator: M. Creatore, Eindhoven University of Technology, The Netherlands


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:20am TF-FrM1
Thin-film Barrier on Foil for Roll-to-Roll OLEDs
F.J.H. van Assche, E.W.A. Young, J.J. Michels, TNO Holst Centre, The Netherlands, G.H. Rietjens, P. van de Weijer, P.C.P. Bouten, Philips Research Laboratories, The Netherlands, A.M.B. van Mol, TNO Holst Centre, The Netherlands
8:40am TF-FrM2
Study on MoO3-x Films Deposited by Reactive Sputtering for Organic Light-Emitting Diodes
N. Oka, H. Watanabe, Y. Sato, Aoyama Gakuin University, Japan, N. Ito, H. Tsuji, Panasonic Electric Works Co., Ltd., Japan, Y. Shigesato, Aoyama Gakuin University, Japan
9:00am TF-FrM3 Invited Paper
Amorphous and Crystalline Metaloxide Semiconductors for Transistor Applications
A. Facchetti, Northwestern University
9:40am TF-FrM5
Permittivity-Engineered TCOs Studied by In Situ Spectroscopic Ellipsometry
J. Burst, National Renewable Energy Laboratory, T.J. Peshek, Arizona State University and National Renewable Energy Laboratory, X. Li, T.A. Gessert, D.H. Levi, National Renewable Energy Laboratory, B.R. Rogers, S. Weiss, Vanderbilt University
10:20am TF-FrM7
Reactive Magnetron Sputter Deposition of Al-doped ZnO Films with Unipolar Pulsing and Impedance Control System
Y. Nishi, K. Hirohata, N. Tsukamoto, Y. Sato, N. Oka, Y. Shigesato, Aoyama Gakuin University, Japan
10:40am TF-FrM8
Study on Spatial Distribution of Electrical Properties for Al-doped ZnO Films Deposited by DC Magnetron Sputtering using Various Inert Gases
Y. Sato, K. Ishihara, N. Oka, Y. Shigesato, Aoyama Gakuin University, Japan
11:00am TF-FrM9
Multilayer Active Coatings on Flexible Polymer Sheet using High Rate, Closed Field Reactive Sputtering
J.M. Walls, Loughborough University, UK, D.R. Gibson, S. Stanley, A.R. Waugh, Applied Multilayers Ltd, UK