AVS 55th International Symposium & Exhibition
    Vacuum Technology Tuesday Sessions

Session VT-TuP
Poster Session, Including Student Poster Competition

Tuesday, October 21, 2008, 6:30 pm, Room Hall D


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

VT-TuP1
Construction of a Laboratory Based Resistance Thermal Evaporator and/or Sputtering Module and the Associated Safety Systems
V. Lambe, A. Pender, Institute of Technology Tallaght, Ireland
VT-TuP2
A Study of a Method to Evaluate the Corrosion Resistance of Al2O3 Coated Vacuum Components for Semiconductor Equipment
J.Y. Yun, S.W. Kang, KRISS, Korea, S.M. You, J.S. Shin, Daejeon University, Korea
VT-TuP4
The PM-IRRAS Study of Water Thin Film on Aluminum Alloy Surface with Vacuum Pumping Down Process Condition
H.P. Hsueh, NSRRC, Taiwan, W.F. Liu, NTHU, Taiwan, C.K. Chan, G.Y. Hsiung, NSRRC, Taiwan, J.R. Chen, NSRRC and NTHU, Taiwan
VT-TuP5
A Novel, UHV Analysis System for Detecting Electron Stimulated Reaction Products Generated during Field Emission Studies
M. Bagge-Hansen, R.A. Outlaw, M.Y. Zhu, H. Chen, D.M. Manos, The College of William and Mary
VT-TuP6
A Compact Deposition Chamber Design for Low Temperature Growth of Ultra-Thin Crystalline Films on Metal-Insulator-Semiconductor Devices
R.E. Lake, J.R. Puls, M.P. Ray, C.E. Sosolik, Clemson University
VT-TuP7
HORST - A New Device for Digital In-Line X-ray Holography
F. Staier, A. Rosenhahn, M. Grunze, University of Heidelberg, Germany
VT-TuP8
The Titan Blimp
J.T. Hagen, Cedarville University
VT-TuP9
Scaling of Low-Pressure Transport Coefficients for Gas Mixture Flow in a Tube
M. Vukovic, Tokyo Electron, US Holdings
VT-TuP10
Vacuum Pressure Simulation for the Upgrade of Front-End at NSLS Insertion Device Beamline
J.-P. Hu, Brookhaven National Laboratory
VT-TuP11
Thermistor Vacuum Gauge; High Sensitivity Shows Direction and Acceleration Which Enables Vacuum Leak Detection
D. Casilio, R. Kromer, Myers Vacuum