| AVS 55th International Symposium & Exhibition | |
| Vacuum Technology | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 1:40pm | VT-TuA1 Pirani Vacuum Gauge for J-PARC 3GeV Synchrotron Vacuum System M. Kuroiwa, S. Fujii, N. Matsumoto, M. Sasaki, Tokyo Electronics Co., Ltd., Japan, N. Ogiwara, Y. Hikichi, Japan Atomic Energy Agency |
| 2:00pm | VT-TuA2 Hot Cathode Ionization Gauge Life Extension in the mTorr range by Operational Modifications P.C. Arnold, Brooks Automation, Inc. |
| 2:20pm | VT-TuA3 Invited Paper Vacuum Metrology in Korea, Value Innovation for Customers K.H. Chung, Korea Research Institute of Standards and Science (KRISS) |
| 3:00pm | VT-TuA5 Investigations of Gas Dynamics in Capacitance Diaphragm Gauges M. Wüest, INFICON Ltd, Balzers, Liechtenstein, V. Kolobov, A. Vasenkov, CFD Research Corporation |
| 4:00pm | VT-TuA8 NIST Experience with New Non-Rotating Force Balanced Piston Gauges for Low Pressure Metrology J.H. Hendricks, National Institute of Standards and Technology |
| 4:20pm | VT-TuA9 UHV Gauges in Theory and Practice M.L. Stutzman, Jefferson Lab, B.R.F. Kendall, Elvac Laboratories |
| 4:40pm | VT-TuA10 A New Static Expansion System for the Spanish Metrology Center (CEM) N. Medina, S. Ruiz, Spanish Metrology Center (CEM), J. Gómez-Goñi, Universidad Politécnica de Madrid, Spain |
| 5:00pm | VT-TuA11 Precision Volume Measurements: Challenges to Reducing Uncertainties S.M. Thornberg, J.M. Hochrein, J.R. Brown, R.D. Boyd, Sandia National Laboratories |
| 5:20pm | VT-TuA12 Thermal Management of Temperature Controlled Capacitive Diaphragm Gauges B. Andreaus, H. Hanselmann, M. Wüest, Ch. Berg, Inficon AG, Liechtenstein |