AVS 55th International Symposium & Exhibition | |
In Situ Microscopy and Spectroscopy: Interfacial and Nanoscale Science Topical Conference | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
8:00am | IS+SY+SS-WeM1 Probing the Electrochemistry of Ceria in Solid-Oxide Fuel Cell Anodes under Operation using Ambient-Pressure XPS H. Bluhm, J.T. Newberg, Z. Liu, Z. Hussain, Lawrence Berkeley National Laboratory, S.C. DeCaluwe, C. Zhang, G.S. Jackson, University of Maryland, College Park, F. El Gabaly, R.L. Farrow, K.F. McCarty, M.A. Linne, A.H. McDaniel, Sandia National Laboratories |
8:20am | IS+SY+SS-WeM2 In-situ Dynamics of CO Oxidation on Pt(110) with Ambient Pressure XPS Z. Yang, F. Aksoy, Z. Liu, Lawrence Berkeley National Laboratory, H. Kondoh, Keio University, Japan, P. Ross, Lawrence Berkeley National Laboratory, B. Mun, Hanyang University, Korea |
8:40am | IS+SY+SS-WeM3 Invited Paper Medard W. Welch Award Lecture: Novel X-ray Photoelectron Spectroscopy Techniques for In Situ Studies of Surfaces in Equilibrium with Gases in the Torr Pressure Regime: Application to Catalysis and Environmental Sciences M. Salmeron, Lawrence Berkeley National Laboratory |
9:20am | IS+SY+SS-WeM5 Invited Paper Nano Scale X-ray Absorption Spectroscopy of In Situ Modified Samples using Scanning Transmission X-ray Microscope T. Tyliszczak, Lawrence Berkeley National Laboratory |
10:40am | IS+SY+SS-WeM9 In Situ Synchrotron X-ray Study of the Synthetic Processes for Inorganic Solid Oxide Nanomaterials Y. Mao, J. Dorman, J.P. Chang, University of California at Los Angeles |
11:00am | IS+SY+SS-WeM10 Surface Chemistry of Model Solid Oxide Fuel Cells Studied In-Situ by Synchrotron Based Photoemission Microscopy and Spectroscopy K. Adib, M. Backhaus-Ricoult, T.P. St. Clair, Corning Incorporated, B. Luerssen, Justus Liebig Universitaet, Germany, L. Gregoratti, A. Barinov, Sincrotrone Elettra, Italy |
11:20am | IS+SY+SS-WeM11 Invited Paper Organic Solar Cells and Microgels: Examples of In Situ Applications of Soft X-ray Microscopy H. Ade, North Carolina State University |