AVS 55th International Symposium & Exhibition
    In Situ Microscopy and Spectroscopy: Interfacial and Nanoscale Science Topical Conference Wednesday Sessions
       Session IS+SY+SS-WeM

Invited Paper IS+SY+SS-WeM11
Organic Solar Cells and Microgels: Examples of In Situ Applications of Soft X-ray Microscopy

Wednesday, October 22, 2008, 11:20 am, Room 310

Session: In Situ Spectroscopy – Interfacial Science and Catalysis
Presenter: H. Ade, North Carolina State University
Correspondent: Click to Email

Soft x-ray microscopy has achieved a spatial resolution of ~ 30-40 nm. At the same time, soft x-rays are penetrating enough to investigate samples sandwiched between thin silicon nitride membranes or thin metal layers. This allows the investigation of wet samples or samples sandwiched between thin electrodes. When coupled with Near Edge X-ray absorption Fine Structure (NEXAFS) spectroscopy, unique characterization capabilities results that range from compositional mapping, to charge state determination and induced current measurements. This presentation will review the state-of-the-art of NEXAFS microscopy. The focus will be on a range of in-situ applications and most extensively on the characterization of microgels and organic solar cells.