AVS 55th International Symposium & Exhibition
    In Situ Microscopy and Spectroscopy: Interfacial and Nanoscale Science Topical Conference Wednesday Sessions
       Session IS+SY+SS-WeM

Paper IS+SY+SS-WeM2
In-situ Dynamics of CO Oxidation on Pt(110) with Ambient Pressure XPS

Wednesday, October 22, 2008, 8:20 am, Room 310

Session: In Situ Spectroscopy – Interfacial Science and Catalysis
Presenter: B. Mun, Hanyang University, Korea
Authors: Z. Yang, Lawrence Berkeley National Laboratory
F. Aksoy, Lawrence Berkeley National Laboratory
Z. Liu, Lawrence Berkeley National Laboratory
H. Kondoh, Keio University, Japan
P. Ross, Lawrence Berkeley National Laboratory
B. Mun, Hanyang University, Korea
Correspondent: Click to Email

Considering the recent increasing demands of improved catalytic materials in energy industry, the understanding clear mechanism of catalytic reactions at an atomic scale level has become more critical. Especially, the formations of oxide on transition metal surface have been actively studied due to its importance in fundamental understanding of heterogeneous catalytic reactions on metal surfaces. In particular, the study of surface oxide on Pt [110] received much attention due to its unique surface reconstruction under high pressure reaction conditions. Previously, with the combinations of high pressure STM and in-situ x-ray diffraction, the formation of surface Pt oxide is observed when the reaction rate is enhanced, and showed the surface oxide formed is stable with carbonate species.1,2 In this work, using the ambient pressure XPS (AP XPS) and mass spectrometer, the in-situ dynamics of CO oxidation on Pt [110] surface are discussed under close to the realistic condition. Under the reaction conditions (T=420K) with the pressure of CO and O gases at 450 mTorr in the AP XPS chamber, our results show that a) the chemisorbed oxygen is not stable under the reaction conditions, b) there is no formation of surface oxide on Pt surface under our reaction conditions.

1 B.L.M. Hendrikson and J.W.M. Frenken, Phys.Rev. Lett. 89, 046101(2002)
2 M.D. Ackermann et al.,Phys.Rev. Lett. 95, 255505(2005).