| AVS 55th International Symposium & Exhibition | |
| Exhibitor Workshops | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 12:40pm | EW-WeL1 Characterization and Optimization of Polyatomic Ions for XPS Depth Profiling of Organic Materials C.J. Blomfield, S.C. Page, D.J. Surman, S.J. Hutton, A.J. Roberts, S.J. Coultas, Kratos Analytical Ltd, UK |
| 1:00pm | EW-WeL2 State-Of-The-Art Software and Surface Analysis at Thermo Fisher Scientific R.G. White, P. Mack, Thermo Fisher Scientific, UK |
| 1:20pm | EW-WeL3 XPS Sputter Depth Profiling and Surface Cleaning with C60 Sputter Ion Beams J.F. Moulder, S.N. Raman, J.S. Hammond, Physical Electronics |