| AVS 55th International Symposium & Exhibition | |
| Exhibitor Workshops | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 12:20pm | EW-TuL1 Combining AFM and Instrumented Nanoindentation for Mechanical Characterization of Materials at the Nanoscale A. Bonilla, Asylum Research |
| 12:40pm | EW-TuL2 Manipulation and Characterization of Nanoobjects in SEM H. Koop, attocube systems AG, Germany |
| 1:00pm | EW-TuL3 Momentum Microscope for Angular and Time Resolved Imaging of Valence Band Electron States B. Krömker, Omicron Nanotechnology GmbH, Germany, M. Escher, FOCUS GmbH, Germany, D. Funnemann, Omicron Nanotechnology GmbH, Germany, D. Hartung, H. Engelhard, Max-Planck-Institut für Mikrostrukturphysik, Germany, K. Winkler, Omicron Nanotechnology GmbH, Germany, J. Kirschner, Max-Planck-Institut für Mikrostrukturphysik, Germany |
| 1:20pm | EW-TuL4 Combined Mechanical and Optical Analysis Methods for Surfaces and Coatings J. Powell, CSM Instruments |