AVS 55th International Symposium & Exhibition
    Electronic Materials and Processing Thursday Sessions

Session EM+NC-ThM
Contacts, Interfaces, and Defects in Semiconductors

Thursday, October 23, 2008, 8:00 am, Room 210
Moderator: F. Ren, University of Florida


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:40am EM+NC-ThM3
Point-probe Tunneling Measurements of Sheet Conductance of Metallized Silicon Surfaces
H. Won, R.F. Willis, The Pennsylvania State University
9:00am EM+NC-ThM4
Photoluminescece Spectroscopy on Near Surface InAs Quantum Dots and Wetting Layers
I. Kamiya, K. Fukui, Toyota Technological Institute, Japan
9:20am EM+NC-ThM5 Invited Paper
Barrier Formation and Transport in Metal Contacts to Nanotubes and Nanowires
A. Talin, F. Leonard, B.S. Swartzentruber, Sandia National Laboratories
10:40am EM+NC-ThM9 Invited Paper
Reliability of III-N Electronic Devices
M. Shur, Rensselaer Polytechnic Institute
11:20am EM+NC-ThM11
The SiC Surface: A Surface of Growing Technological Importance
C.R. Eddy, Jr., D.K. Gaskill, M.A. Mastro, R.T. Holm, B.L. VanMil, R.L. Myers-Ward, M.E. Twigg, Y.N. Picard, U.S. Naval Research Laboratory, P.G. Neudeck, A.J. Trunek, J.A. Powell, NASA Glenn Research Center
11:40am EM+NC-ThM12
Investigation of Negative Electron Affinity in Hydrogen Complex Deactivated Surface of InP:Zn (100)
M.D. Williams, Clark Atlanta University