| AVS 55th International Symposium & Exhibition | |
| Electronic Materials and Processing | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:40am | EM+NC-ThM3 Point-probe Tunneling Measurements of Sheet Conductance of Metallized Silicon Surfaces H. Won, R.F. Willis, The Pennsylvania State University |
| 9:00am | EM+NC-ThM4 Photoluminescece Spectroscopy on Near Surface InAs Quantum Dots and Wetting Layers I. Kamiya, K. Fukui, Toyota Technological Institute, Japan |
| 9:20am | EM+NC-ThM5 Invited Paper Barrier Formation and Transport in Metal Contacts to Nanotubes and Nanowires A. Talin, F. Leonard, B.S. Swartzentruber, Sandia National Laboratories |
| 10:40am | EM+NC-ThM9 Invited Paper Reliability of III-N Electronic Devices M. Shur, Rensselaer Polytechnic Institute |
| 11:20am | EM+NC-ThM11 The SiC Surface: A Surface of Growing Technological Importance C.R. Eddy, Jr., D.K. Gaskill, M.A. Mastro, R.T. Holm, B.L. VanMil, R.L. Myers-Ward, M.E. Twigg, Y.N. Picard, U.S. Naval Research Laboratory, P.G. Neudeck, A.J. Trunek, J.A. Powell, NASA Glenn Research Center |
| 11:40am | EM+NC-ThM12 Investigation of Negative Electron Affinity in Hydrogen Complex Deactivated Surface of InP:Zn (100) M.D. Williams, Clark Atlanta University |