AVS 54th International Symposium
    Nanometer-scale Science and Technology Tuesday Sessions

Session NS+MS-TuA
Characterization of Nanostructures

Tuesday, October 16, 2007, 1:40 pm, Room 616
Moderator: R.F. Klie, University of Illinois - Chicago


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

1:40pm NS+MS-TuA1
Atomic-scale Deformation in N-doped Carbon Nanotubes
C.-L. Sun, Academia Sinica, Taiwan, H.-W. Wang, M. Hayashi, L.-C. Chen, National Taiwan University, K.-H. Chen, Academia Sinica, Taiwan
2:00pm NS+MS-TuA2 Invited Paper
Four-Tip Scanning Tunneling Microscope for Measuring Transport in Nanostructures
S. Hasegawa, University of Tokyo, Japan
2:40pm NS+MS-TuA4
A Novel Approach for Electronic Nanotechnology of Carbon Nanotubes
K.E. Hurst, National Institute of Standards and Technology, R.K. Ahrenkiel, National Renewable Energy Laboratory, T. Campbell, ADA Technologies, J.H. Lehman, National Institute of Standards and Technology
3:00pm NS+MS-TuA5
Properties of the Surface and Core Region of Single CdS Nanowires
S.F. Alvarado, IBM Research, Zurich Research Laboratory, Switzerland, O. Hayden, Siemens AG, Germany
4:00pm NS+MS-TuA8 Invited Paper
Helium-ion Microscopy for Nanostructure Characterization
N.P. Economou, B. Ward, J. Notte, R. Hill, L.A. Stern, Carl Zeiss SMT
4:40pm NS+MS-TuA10
Study of Characteristic Fragmentation of Nano Carbon by the Scanning Atom Probe
O. Nishikawa, M. Taniguchi, Kanazawa Institute of Technology, Japan, Y. Saito, Nagoya University, Japan, M. Ushirozawa, Japan Broadcasting Corporation
5:00pm NS+MS-TuA11
Nano-scale Surface Effects of Field Electron Emission from Zirconium and Hafnium Carbide
W.A. Mackie, G.M. Magera, K.J. Kagarice, Applied Physics Technologies