AVS 54th International Symposium
    Nanometer-scale Science and Technology Tuesday Sessions
       Session NS+MS-TuA

Invited Paper NS+MS-TuA2
Four-Tip Scanning Tunneling Microscope for Measuring Transport in Nanostructures

Tuesday, October 16, 2007, 2:00 pm, Room 616

Session: Characterization of Nanostructures
Presenter: S. Hasegawa, University of Tokyo, Japan
Correspondent: Click to Email

Since the establishment of techniques for surface conductivity measurement by microscopic four-point probes (M4PP).1-5 with four-tip scanning tunneling microscope (4T-STM) and monolithic four-point probes, electronic transport through single-atomic layers on semiconductor crystals has attracted considerable interests. The electrical conduction through atomic chains and nanowires can also be measured by the methods. Interesting transport properties of such atomic-scale structures have been revealed; the instability and atomic-scale defects intrinsic to such nano-scale structures play decisive roles in transport. I will introduce and summarize the following several topics in the talk. Recent advancements with metal-coated carbon nanotube tips in 4T-STM are also introduced.11) (1) A metal-insulator transition and strong anisotropy in conductivity of Indium atomic wire arrays.1,6 (2) Resistance caused by monatomic steps on surface .12 (3) Non-metallic conduction of metallic Au wires and monolayers7,10 (4) Conductance of individual silicide nano-wires and carbon nanotubes.8,9,13

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