|AVS 54th International Symposium|
|Nanometer-scale Science and Technology||Tuesday Sessions|
|Session:||Characterization of Nanostructures|
|Presenter:||S. Hasegawa, University of Tokyo, Japan|
|Correspondent:||Click to Email|
Since the establishment of techniques for surface conductivity measurement by microscopic four-point probes (M4PP).1-5 with four-tip scanning tunneling microscope (4T-STM) and monolithic four-point probes, electronic transport through single-atomic layers on semiconductor crystals has attracted considerable interests. The electrical conduction through atomic chains and nanowires can also be measured by the methods. Interesting transport properties of such atomic-scale structures have been revealed; the instability and atomic-scale defects intrinsic to such nano-scale structures play decisive roles in transport. I will introduce and summarize the following several topics in the talk. Recent advancements with metal-coated carbon nanotube tips in 4T-STM are also introduced.11) (1) A metal-insulator transition and strong anisotropy in conductivity of Indium atomic wire arrays.1,6 (2) Resistance caused by monatomic steps on surface .12 (3) Non-metallic conduction of metallic Au wires and monolayers7,10 (4) Conductance of individual silicide nano-wires and carbon nanotubes.8,9,13
1T. Kanagawa, et al., Phys. Rev. Lett. 91, 036805 (2003).
2T. Tanikawa, et al., e-J. Surf. Sci. Nanotech. 1, 50 (2003)[http://dx.doi.org/10.1380/ejssnt.2003.50]
3S. Hasegawa, et al., J. Phys.: Condens. Matter 14, 8379 (2002).
4S. Hasegawa, et al., Surf. Rev. Lett. 10, 963 (2002).
5R. Hobara, et al., Rev. Sci. Inst. 78, 053705 (2007).
6T. Tanikawa, et al., Phys. Rev. Lett. 93, 016801 (2004).
7H. Okino, et al., Phys. Rev. B 70, 113404 (2004).
8H. Okino, et al., Appl. Phys. Lett., submitted.
9R. Hobara, et al., Jpn. J. Appl. Phys. 43, L1081 (2004).
10S. Yamazaki, et al., submitted to Phys. Rev. Lett.
11Y. Murata, et al., Jpn. J. Appl. Phys. 44, 5336 (2005); S. Yosimodo, et al., ibid. 44, L1563 (2005).
12I. Matsuda, et al., Phys. Rev. Lett. 93, 236801 (2004).
13S. Yoshimoto, et al., Nano Letters 7, 956 (2007).