|AVS 54th International Symposium|
|Nanometer-scale Science and Technology||Tuesday Sessions|
|Session:||Characterization of Nanostructures|
|Presenter:||S.F. Alvarado, IBM Research, Zurich Research Laboratory, Switzerland|
|Authors:||S.F. Alvarado, IBM Research, Zurich Research Laboratory, Switzerland
O. Hayden, Siemens AG, Germany
|Correspondent:||Click to Email|
The properties of the surface and core region of single CdS nanowires are characterized by STM-based cathodoluminescence under ultrahigh-vacuum conditions at room temperature. The CdS nanowires were fabricated using pulsed laser deposition via metal-cluster-catalyzed growth. A diluted nanowire suspension was used to flow-align the nanowires on a p-type Si substrate using microfluidic channels. Cathodoluminescence is excited by using the tip of an STM as a source of low-energy electrons (100 < Ekin < 1000 eV) at currents in the pico- to microampere range. The penetration depth of the incident electrons is approx. 1 nm at 100 eV and increases with kinetic energy up to a few nanometers at 1 keV. Therefore this technique allows one to probe the surface region of single nanostructures. A typical spectrum collected on a single nanowire exhibits a relatively sharp emission line centered at approx. 510 nm, with a full width at half maximum of 20 nm, and a much broader band centered at 750 nm. The intensity ratio of the 510 nm to the 750 nm line increases with increasing electron energy, indicating that the 750-nm emission arises from the surface regions of the nanowires, whereas the 510 nm line originates mainly from their core regions. In addition, cathodoluminescence images of single CdS nanowires, collected at different wavelengths, exhibit regions of enhanced emission as well as local variations of the ratio of surface and core contributions. A comparison of cathodoluminescence spectra collected on nanowires, on a CdS nanosheet, and on other structures, suggests a relationship between the ratio of surface-to-core emission and the quality of the nanowires.