| 1:40pm |
AS+BI+NS-WeA1
UPS Work Function Measurements on Polymers Combined with C60 Depth Profiling
S. Raman, J. Moulder, J.S. Hammond, Physical Electronics, N. Sanada, M. Suzuki, ULVAC-PHI, Inc. |
| 2:00pm |
AS+BI+NS-WeA2
Patterning and Bonding of Poly(dimethylsiloxane) A Simple New Method for Creating Optically Transparent Biocompatible Surfaces and Robust Microfluidic Devices
P.R. Norton, N. Patrito, J. McLachlan, J. Chan, S. Faria, S. Tadayyon, University of Western Ontario, Canada |
| 2:20pm |
AS+BI+NS-WeA3
Interfacial Structure of Polymer Brush and Gel Investigated by Sum Frequency Generation Spectroscopy
K. Uosaki, H. Noguchi, S. Nihonyanagi, H. Minowa, R. Yamamoto, Hokkaido University, Japan |
| 2:40pm |
AS+BI+NS-WeA4 Invited Paper
Multiphoton Patterning of Planar and Topographically Complex Surfaces for Control of Photon, Electron, and Chemical Transport
P.V. Braun, University of Illinois at Urbana-Champaign |
| 4:00pm |
AS+BI+NS-WeA8
Chemical Modification of Self-Assembled Monolayer Surfaces using Soft-Landing of Mass-Selected Ions
P. Wang, O. Hadjar, J. Laskin, Pacific Northwest National Laboratory |
| 4:20pm |
AS+BI+NS-WeA9
TOF-SIMS Analysis of Polypropylene Films Modified by Isotopically Labeled Methane Flames
S.J. Pachuta, M.A. Strobel, 3M Company |
| 4:40pm |
AS+BI+NS-WeA10
The Analysis of Oxidation Profiles in Elastomers Using ToF-SIMS
J.A. Ohlhausen, M.C. Celina, M.R. Keenan, Sandia National Laboratories |
| 5:00pm |
AS+BI+NS-WeA11
Surface Chemical Analysis of Nano-Scaled r.f. Plasma Polymer and Co-Polymer Films by using a Combination of "In-Situ"and Ex-Situ Characterization Tools: Hydroxylated and Aminated Surfaces by XPS, ToF-SIMS and NEXAFS Spectroscopy
W.E.S. Unger, A. Lippitz, S. Swaraj, E. Yegen, Federal Institute for Materials Research and Testing (BAM), Germany |