| AVS 54th International Symposium | |
| Applied Surface Science | Wednesday Sessions |
| Session AS+BI+NS-WeA |
| Session: | Fabrication and Characterization of Functional Soft Material Surfaces |
| Presenter: | S. Raman, Physical Electronics |
| Authors: | S. Raman, Physical Electronics J. Moulder, Physical Electronics J.S. Hammond, Physical Electronics N. Sanada, ULVAC-PHI, Inc. M. Suzuki, ULVAC-PHI, Inc. |
| Correspondent: | Click to Email |
The performance of ultra thin organic films in organic LED’s (OLED) is dependent on the work functions of the electrodes and polymers forming the OLED junctions. Historically, the work functions have frequently been derived from the secondary electron emission edges measured with UPS. The recent applications of C60 ion beams for the sputter removal of a surface layer of many organic materials, leaving the remaining surface with minimal chemical damage, have offered a new tool for studying surface modified polymers. By combining these two techniques, the work function and composition as a function of depth of polymers targeted for OLED applications can be characterized by XPS and UPS. The surface characterization of OLED component polymers exposed to deleterious environments will also be discussed. The possible chemical surface damage induced by the C60 ion beams will be examined by both XPS and UPS spectra and secondary electron emission edge spectra.