| AVS 66th International Symposium & Exhibition | |
| New Challenges to Reproducible Data and Analysis Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | RA+AS+BI-WeA1 Responding to New and Old Challenges to Data, Analysis and Scientific Study Reproducibility Donald Baer, Pacific Northwest National Laboratory, I.S. Gilmore, National Physical Laboratory, UK |
| 2:40pm | RA+AS+BI-WeA2 Achieving Reproducible Data: Examples from Surface Analysis in Semiconductor Technology Thierry Conard, P.A.W. van der Heide, A. Vanleenhove, C. Zborowski, W. Vandervorst, IMEC, Belgium |
| 3:00pm | RA+AS+BI-WeA3 Invited Paper New Challenges in Analytical Reproducibility Illustrated with Old and New Case Studies Thomas Beebe Jr, University of Delaware |
| 4:20pm | RA+AS+BI-WeA7 Invited Paper Challenges and Approaches to Addressing Reproducibility in Biointerface Science and Engineering Sally McArthur, Swinburne University of Technology and CSIRO. Australia |
| 5:00pm | RA+AS+BI-WeA9 Invited Paper Complementary Measurements of Colloidal Nanoparticles and their Coatings by In-situ and Vacuum-based Methods Caterina Minelli, National Physical Laboratory, UK |
| 5:40pm | RA+AS+BI-WeA11 Multiple Technique Analysis of Perovskite Materials used in Battery and Fuel Cell Components Robin Simpson, P. Mack, T.S. Nunney, Thermo Fisher Scientific, UK |
| 6:00pm | RA+AS+BI-WeA12 Mapping Local Physical Properties by Combining ToF-SIMS Analysis with Advanced Scanning Probe Microscopy Maiglid Andreina Moreno Villavicencio, N. Chevalier, J.-P. Barnes, CEA-LETI, France, P. Kermagoret, F. Lorut, ST Microelectronics, France, B. Gautier, Université de Lyon, France |