| AVS 66th International Symposium & Exhibition | |
| Chemical Analysis and Imaging Interfaces Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | CA+NS+SS+VT-ThA1 Invited Paper Helium and Neon Ion Beams for the Imaging and Analysis of Interfaces John A. Notte, C. Guillermier, F. Khanom, B. Lewis, Carl Zeiss PCS, Inc. |
| 3:00pm | CA+NS+SS+VT-ThA3 Invited Paper Interfacial Studies using Ambient Pressure XPS Paul Dietrich, A. Thissen, SPECS Surface Nano Analysis GmbH, Germany |
| 4:00pm | CA+NS+SS+VT-ThA6 Invited Paper Operando Spectroscopy and Microscopy of the Electrode-Electrolyte Interface in Batteries Feng Wang, Brookhaven National Laboratory |
| 4:40pm | CA+NS+SS+VT-ThA8 Ultrasensitive Combined Tip- and Antenna-Enhanced Infrared Nanoscopy of Protein Complexes B.T. O'Callahan, Pacific Northwest National Laboratory, M. Hentschel, University of Stuttgart, Germany, M.B. Raschke, University of Colorado Boulder, P.Z. El-Khoury, Pacific Northwest National Laboratory, Scott Lea, Pacific Norththwest National Laboratory |
| 5:00pm | CA+NS+SS+VT-ThA9 Imaging and Processing in Liquid Gel Solutions with Focused Electron and X-ray Beams T. Gupta, National Institute of Standards and Technology (NIST), P. Zeller, M. Amati, L. Gregoratti, Elettra - Sincrotrone Trieste, Trieste, Italy, Andrei Kolmakov, National Institute of Standards and Technology (NIST) |
| 5:20pm | CA+NS+SS+VT-ThA10 Invited Paper In Situ TEM Visualization of Solution-based Nanofabrication Processes: Chemical Wet-etching and Capillary Forces Utkur Mirsaidov, National University of Singapore |