AVS 66th International Symposium & Exhibition
    Advanced Surface Engineering Division Wednesday Sessions
       Session SE+AS+TF-WeA

Invited Paper SE+AS+TF-WeA7
From Gas-ion to Metal-ion-controlled Irradiation: A Paradigm Shift in the Thin Film Growth by Magnetron Sputtering

Wednesday, October 23, 2019, 4:20 pm, Room A215

Session: Nanostructured Thin Films and Coatings
Presenter: Grzegorz Greczynski, Linköping University, Sweden
Authors: G. Greczynski, Linköping University, Sweden
I. Petrov, University of Illinois at Urbana-Champaign
J.E. Greene, University of Illinois at Urbana-Champaign
L. Hultman, Linköping University, Sweden
Correspondent: Click to Email

Ion irradiation is a key tool for controlling the nanostructure, phase content, and physical properties of refractory ceramic thin films grown at low temperatures (Ts) by magnetron sputtering. However, in contrast to gas-ion bombardment, the effects of metal-ion irradiation on properties of these films have not been extensively studied due to (i) low metal-ion concentrations during standard dc magnetron sputtering (DCMS), and (ii) difficulties in separating metal-ion from gas-ion fluxes. These issues were recently resolved with our development of high‑power pulsed magnetron sputtering (HiPIMS), in which pulsed substrate bias is applied in synchronous to the metal-ion-rich portion of each pulse.1 Careful choice of sputtering conditions allows exploitation of gas rarefaction effects such that the charge state, energy, and momentum of metal ions incident at the growing film surface can be tuned.

The results of time-resolved mass spectrometry analyses performed at the substrate position during HiPIMS and HiPIMS/DCMS co-sputtering of transition-metal (TM) targets in Ar and Ar/N atmospheres are reviewed. Knowledge of the temporal evolution of metal- and gas-ion fluxes is essential for precise control of the incident metal-ion energy and minimizing the role of gas-ion irradiation. Also, covered are the growth of TM nitride and boride alloys by metal-ion synchronized HiPIMS. In contrast to gas-ions, a fraction of which are trapped at interstitial sites, metal-ions are primarily incorporated at lattice sites resulting in much lower compressive stresses. In addition, the closer mass match with the film-forming species results in more efficient momentum transfer and provides the recoil density and energy necessary to eliminate film porosity at low Ts. Several novel film-growth pathways are described: (i) nanostructured N-doped bcc-CrN0.05 films combining properties of both metals and ceramics, (ii) fully-dense, hard, and stress-free Ti0.39Al0.61N, (iii) single-phase cubic Ti1‑xSixN with the highest reported SiN concentrations, (iv) unprecedented AlN supersaturation in single-phase NaCl-structure V1‑xAlxN, (v) a dramatic increase in the hardness, due to selective heavy-metal-ion bombardment during growth, of dense Ti0.92Ta0.08N and Ti0.41Al0.51Ta0.08N films deposited with no external heating, and (vi) simultaneous increase in both hardness and toughness of Zr1-xTaxBy layers deposited with synchronized Ta+ irradiation.

Finally, Ti1-xTaxN alloys grown with no external heating are shown to produce high-quality Cu diffusion barriers and provide excellent corrosion protection for stainless-steel substrates.


1 G. Greczynski, J. Lu, J. Jensen, I. Petrov, J.E. Greene, S. Bolz, W. Kölker, Ch. Schiffers, O. Lemmer and L. Hultman, J. Vac. Sci. Technol. A 30 (2012) 061504