| AVS 66th International Symposium & Exhibition | |
| Nanometer-scale Science and Technology Division | Thursday Sessions |
| Session NS-ThA |
| Session: | SPM for Functional Characterization |
| Presenter: | Georg Ernest Fantner, École Polytechnique Fédéral de Lausanne, Switzerland |
| Authors: | G.E. Fantner, École Polytechnique Fédéral de Lausanne, Switzerland N. Hosseini, École Polytechnique Fédéral de Lausanne, Switzerland M. Neuenschwander, École Polytechnique Fédéral de Lausanne, Switzerland B. Ghadiani, École Polytechnique Fédéral de Lausanne, Switzerland |
| Correspondent: | Click to Email |
The cantilever is arguably the most important part in the measurement chain of an atomic force microscope (AFM), because it transduces the interaction with the sample to a measurable quantity. While a large variety of different cantilevers are available for different AFM modes, most of these cantilevers use the same concepts as the first AFM cantilevers developed 30 years ago. The progress in AFM towards techniques such as high-speed AFM and multiparametric imaging puts new demands on the AFM cantilevers. In this talk I will discuss several ways we are exploring to increase the performance of AFM cantilevers by using non-standard materials, fabrication processes and actuation schemes. Applications of these new cantilevers are high-speed AFM multi-parametric imaging, and correlated microscopy.