| AVS 66th International Symposium & Exhibition | |
| Applied Surface Science Division | Monday Sessions |
| Session AS+BI+RA-MoM |
| Session: | Quantitative Surface Analysis I/Reproducibility Issues in Quantitative XPS |
| Presenter: | Christopher Moffitt, Kratos Analytical Limited |
| Authors: | J.D.P. Counsell, Kratos Analytical Limited, UK C.J. Blomfield, Kratos Analytical Limited, UK C. Moffitt, Kratos Analytical Limited N. Gerrard, Kratos Analytical Limited, UK S.J. Coultas, Kratos Analytical Limited, UK |
| Correspondent: | Click to Email |
XPS is now a truly interdisciplinary technique used in a wide variety of fields including catalysis, tribology, bioremediation and nuclear energy. With more than 1000 instruments currently in use, the ubiquitous nature of XPS means there is a greater requirement than ever for clarity regarding spectral acquisition, analysis and interpretation. The XPS user base has changed significantly – no longer the field of dedicated “technical experts” and spectroscopists – requiring instruments to be simple to use with a higher degree of automation in all parts of operation and analysis.
Here we will discuss the overall procedure for the technique specifying the critical steps in generating sound data and conclusions. Pitfalls and perils in the following steps will be briefly discussed: surface charging, beam damage, contamination, peak identification, energy calibration, quantification, peak-fitting, database usage, chemical state assignment and error reporting as will the latest methods implemented in mitigating against these issues. Worked examples and user studies will be presented to illustrate common inconsistencies.