| AVS 65th International Symposium & Exhibition | |
| Nanometer-scale Science and Technology Division | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | NS+AN+EM+MN+MP+RM-TuM1 Invited Paper Parametric Nonlinear Interactions in Nanofabricated Silicon-based Photonics Amy Foster, Johns Hopkins University |
| 8:40am | NS+AN+EM+MN+MP+RM-TuM3 Invited Paper Ultrafast Optical Pulse Shaping using Dielectric Metasurfaces Amit Agrawal, S. Divitt, W. Zhu, C. Zhang, H.J. Lezec, NIST Center for Nanoscale Science and Technology |
| 9:20am | NS+AN+EM+MN+MP+RM-TuM5 Invited Paper Single-Particle Nanophotonics and Materials Investigations with Optical Microresonator Spectrometers Erik Horak, University of Wisconsin - Madison, K.D. Heylman, K.A. Knapper, M.T. Rea, F. Pan, L.T. Hogan, R.H. Goldsmith, University of Wisconsin-Madison |
| 11:00am | NS+AN+EM+MN+MP+RM-TuM10 Invited Paper Optomechanical Interactions for Metrology and Signal Processing Karen Grutter, The Laboratory for Physical Sciences |
| 11:40am | NS+AN+EM+MN+MP+RM-TuM12 Invited Paper Cold-atom based Sensors and Standards Stephen Eckel, D.S. Barker, J.A. Fedchak, N.N. Klimov, E. Norrgard, J. Scherschligt, National Institute of Standards and Technology |