| AVS 65th International Symposium & Exhibition | |
| Nanometer-scale Science and Technology Division | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | NS+AM+AS+MN+PC+PS+SS+TR-FrM1 Invited Paper Using Self-Assembly to Engineer Electronic Properties in 1D and 2D Molecular Nanostructures Michael F. Crommie, University of California at Berkeley Physics Dept. |
| 9:00am | NS+AM+AS+MN+PC+PS+SS+TR-FrM3 Chemical and Electronic Structure of Aniline Films on Silica Surfaces Christopher Goodwin, University of Delaware, A.J. Maynes, Virginia Polytechnic Institute and State University, Z.E. Voras, University of Delaware, S.A. Tenney, Center for Functional Nanomaterials Brookhaven National Laboratory, T.P. Beebe, University of Delaware |
| 9:20am | NS+AM+AS+MN+PC+PS+SS+TR-FrM4 Electric Field Driven Chemical Reaction of Individual Molecular Subunits by Scanning Tunneling Microscopy Tomasz Michnowicz, Max Planck Institute for Solid State Research, Germany, Deutschland, B. Borca, Max Planck Institute for Solid State Research, Germany, R. Pétuya, Donostia International Physics Centre, Spain, M. Pristl, R. Gutzler, V. Schendel, I. Pentegov, U. Kraft, H. Klauk, Max Planck Institute for Solid State Research, Germany, P. Wahl, University of St Andrews, UK, A. Arnau, Donostia International Physics Centre, Spain, U. Schlickum, K. Kern, Max Planck Institute for Solid State Research, Germany |
| 9:40am | NS+AM+AS+MN+PC+PS+SS+TR-FrM5 Characterising Conjugated Polymers for Organic Electronics by High-resolution Scanning Probe Microscopy Giovanni Costantini, University of Warwick, UK |
| 10:00am | NS+AM+AS+MN+PC+PS+SS+TR-FrM6 Probing Electrical Degradation of Lithium Ion Battery Electrodes with Nanoscale Resolution Seong Heon Kim, Samsung Advanced Institute of Technology, Republic of Korea, S.Y. Park, H. Jung, Samsung Advanced Institue of Technology, Republic of Korea |