AVS 65th International Symposium & Exhibition | |
In-situ Microscopy, Spectroscopy, and Microfluidics Focus Topic | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
MM-TuP1 In-situ Low Energy Electron Microscopy at Near Ambient Pressures Thomas Schulmeyer, SPECS Surface Nano Analysis GmbH |
MM-TuP2 NanoESCA III: Recent Progress and Applications M. Merkel, N.B. Weber, M. Escher, T.-J. Kühn, FOCUS GmbH, Germany, Marten Patt, Scienta Omicron GmbH, Germany |