| AVS 65th International Symposium & Exhibition | |
| Applied Surface Science Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | AS+NS-ThA1 Surface Science Study of Au/Ni/Cr/n-SiC and Au/Cr/Ni/n-SiC Thin Film Ohmic Contact Material Martyn Kibel, La Trobe University, Australia, A.J. Barlow, La Trobe University, Australia, P.W. Leech, RMIT University, Australia |
| 2:40pm | AS+NS-ThA2 3D Imaging of InGaN/GaN based Nanowires and Nanotubes using Time-of-flight Secondary Ion Mass Spectrometry Jean-Paul Barnes, Univ. Grenoble Alpes, CEA, LETI, France, A. Kapoor, Univ. Grenoble Alpes, CEA, France, C. Durand, Univ. Grenoble Alpes, CEA, France, C. Bougerol, Univ. Grenoble Alpes, CNRS, France, J. Eymery, Univ. Grenoble Alpes, CEA, France |
| 3:00pm | AS+NS-ThA3 Invited Paper Atom Probe Tomography: Applications and Prospects for Surface and Interface Science Austin Akey, D.C.. Bell, Harvard University |
| 4:20pm | AS+NS-ThA7 Industrial Applications of Surface Analysis in Chemical Mechanical Planarization Hong Piao, Y.N. Liang, J. McDonough, C. Ballesteros, FUJIFILM Planar Solutions, LLC, FUJIFILM Electronic materials USA., Inc., E. Turner, FUJIFILM Planar Solutions, LLC, FUJIFILM Electronic materials USA., Inc, A. Mishra, R. Wen, FUJIFILM Planar Solutions, LLC, FUJIFILM Electronic materials USA., Inc. |
| 4:40pm | AS+NS-ThA8 Correlative Images of Microscopy Spectroscopy: Beyond the 3D Characterization in Surface Analysis Tanguy Terlier, Korea Institute of Science and Technology, Republic of Korea, R. Verduzco, Shared Equipment Authority, Rice University, Y. Lee, Korea Institute of Science and Technology, Republic of Korea |
| 5:00pm | AS+NS-ThA9 3D Structure of Atomically Dispersed Metal Species on an Oxide Single Crystal Surface Studied by Polarization-dependent Total Reflection Fluorescence (PTRF)-XAFS Satoru Takakusagi, K. Asakukra, Hokkaido University, Japan |
| 5:20pm | AS+NS-ThA10 XPS Imaging and Spectromiscroscopy Investigation of Extended Release Pharmaceutical Tablets Jonathan Counsell, S.J. Coultas, C.J. Blomfield, Kratos Analytical Ltd, UK, D.J. Scurr, The University of Nottingham, UK, L. Mason, University of Nottingham, UK, V. Ciarnelli, J.M. Garfitt, S. Rigby-Singleton, Juniper Pharma Services Ltd, UK, M.R. Alexander, The University of Nottingham, UK, M.C. Davies, University of Nottingham, UK, C. Moffitt, Kratos Analytical Inc., S.J. Hutton, Kratos Analytical Ltd, UK |
| 5:40pm | AS+NS-ThA11 An experimental Guide to Conversion of Tof-SIMS Spectrum to BIG DATA: Application in Analysis of Ultrathin Coatings Kevin Abbasi, A.A. Avishai, Swagelok Center for Surface Analysis of Materials, Case school of Engineering, Case Western Reserve University |