AVS 65th International Symposium & Exhibition
    Thin Films Division Monday Sessions
       Session TF+EM+MI+PS-MoA

Paper TF+EM+MI+PS-MoA8
Stabilization of Ferroelectric Phase of Hf0.5Zr0.5O2on NbN at 4 K

Monday, October 22, 2018, 3:40 pm, Room 102A

Session: Thin Films for Advanced Memory Applications and Magnetics
Presenter: Michael David Henry, Sandia National Laboratories
Authors: M.D. Henry, Sandia National Laboratories
S. Smith, Sandia National Laboratories
R. Lewis, Sandia National Laboratories
J. Ihlefeld, University of Virginia
Correspondent: Click to Email

This work demonstrates cryogenic ferroelectric behavior of atomic layer deposited (ALD) hafnium zirconium oxide (HZO) using reactively sputtered niobium nitride electrodes. With the discovery of ferroelectricity in doped HfO2, perturbations of the dopants expanded from silicon into mixtures utilizing yttrium and zirconium and with electrodes ranging from platinum to nitrides such as titanium nitride and tantalum nitride. This set of materials have demonstrated stabilizing a crystalline phase permitting both ferroelectric and anti-ferroelectric behaviors to have been observed. With the atomic similarities between Ta and Nb, a natural extension the electrode materials’ set to include NbN was explored in this work.

Devices tested at both room temperature (RT) and under cryogenic conditions demonstrated ferroelectric behavior as determined by polarization vs. electric field (P-E) loops. The polarization results show comparable ferroelectric behavior at room temperature and 4 K, however the effect of the dielectric polarization is combined with the remnant polarization (Pr) in this measurement. To separate the two effects, remnant polarization sweeps were performed and plotted only displaying the Pr. A typical measurement on a 170 mm diameter device, was performed starting at 4 K and ending at 150 K. By adding the positive and negative Prwith the electric field at 0 MV/cm (2Pr), polarization was observed to decrease as the stage was warmed up. A second known behavior of ferroelectrics is the so-called wake-up effect where the ferroelectric phase is understood to be stabilized by oxygen movement as a positive and negative voltage is applied. Here, a 3 V square wave at 1Hz was utilized in 60 second intervals with Prloops performed before and after each wake-up cycling at room temperature. The 2Prwas seen to come to steady state after approximately 100 seconds. Remnant polarization at the conclusion of 360 seconds is seen to have polarization approximately 10 mC/cm2, a value comparable to other findings. Polarization values of approximately 10 mC/cm2suggest that these ferroelectric films could be utilized with superconductors at liquid He temperatures for a new class of superconductor-ferroelectric based devices.

Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA-0003525. The views expressed in the article do not necessarily represent the views of the U.S. Department of Energy or the United States Government.