AVS 65th International Symposium & Exhibition
    Thin Films Division Thursday Sessions
       Session TF+AS+EL+PS-ThM

Paper TF+AS+EL+PS-ThM6
Model for Amorphous Thin Film Formation and Validation

Thursday, October 25, 2018, 9:40 am, Room 102A

Session: In-situ Characterization and Modeling of Thin Film Processes
Presenter: Rahul Basu, VTU, India
Correspondent: Click to Email

A coupled set of equations describing heat and mass transfer during phase transformation is formulated The model is extended to incorporate surface convective effects. These equations which are non linear due to the moving interface are linearized and decoupled. Effects of various heat transfer parameters are analyzed through small parameter expansions. Solutions obtained via this artifice allow closer examination of surface effects on the boundary layer of the phase transformation. A relation is found for the effect of the glass transition temperature versus the boundary layer thickness for several alloys in various groups of the Periodic Table. Earlier work and results are analyzed in light of the present analysis.