AVS 65th International Symposium & Exhibition | |
Thin Films Division | Thursday Sessions |
Session TF+AS+EL+PS-ThM |
Session: | In-situ Characterization and Modeling of Thin Film Processes |
Presenter: | Brian I. Johnson, Brigham Young University |
Authors: | M.R. Linford, Brigham Young University B.I. Johnson, Brigham Young University R.S. Turley, Brigham Young University D.D. Allred, Brigham Young University |
Correspondent: | Click to Email |