AVS 65th International Symposium & Exhibition | |
In-situ Microscopy, Spectroscopy, and Microfluidics Focus Topic | Monday Sessions |
Session MM+AS+NS+PC+SS-MoA |
Session: | X-ray and Electron Spectromicroscopy in Liquids and Gases & Flash Networking Session |
Presenter: | Tomas Duchon, Forschungszentrum Juelich GmbH, Germany |
Authors: | S. Nemsak, Forschungszentrum Juelich GmbH, Germany E. Strelcov, NIST Center for Nanoscale Science and Technology T. Duchon, Forschungszentrum Juelich GmbH, Germany H.X. Guo, National Institute of Standards and Technology J. Hackl, Forschungszentrum Juelich GmbH, Germany A. Yualev, NIST Center for Nanoscale Science and Technology I. Vlassiouk, Oak Ridge National Laboratory D.N. Mueller, Forschungszentrum Juelich GmbH, Germany C.M. Schneider, Forschungszentrum Juelich GmbH, Germany A. Kolmakov, NIST Center for Nanoscale Science and Technology |
Correspondent: | Click to Email |