AVS 65th International Symposium & Exhibition | |
In-situ Microscopy, Spectroscopy, and Microfluidics Focus Topic | Monday Sessions |
Session MM+AS+NS+PC+SS-MoA |
Session: | X-ray and Electron Spectromicroscopy in Liquids and Gases & Flash Networking Session |
Presenter: | Hongxuan Guo, National Institute of Standards and Technology (NIST)/ University of Maryland, College Park |
Authors: | H.X. Guo, National Institute of Standards and Technology (NIST)/ University of Maryland, College Park A. Yulaev, National Institute of Standards and Technology (NIST)/ University of Maryland, College Park E. Strelcov, National Institute of Standards and Technology (NIST)/ University of Maryland, College Park A. Tselev, CICECO and Department of Physics, University of Aveiro,Portugal A. Kolmakov, National Institute of Standards and Technology |
Correspondent: | Click to Email |
In this presentation, we demonstrate the feasibility of in-situ scanning electron microscopy to observe the changes in electric double layer in different electrolytes upon polarization. We designed an electrochemical liquid cell with electron transparent electrode made of bilayer graphene.5,6. We monitored the changes in secondary electron yield from the graphene-liquid interface upon electrolyte polarization. We found that the normalized SEM image contrast is linear with the applied bias voltage and is related to the concentration and distribution of the ions at the interface. The analysis of SEM videos provide insight on long term kinetics of ionic moieties in electrolyte during polarization. This experimental methodology will be helpful for understanding the structure, property, and dynamics of the electric double layer at solid -electrolyte interfaces.
Reference
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[4]. J. M. Black, M. Zhu, P. Zhang, R. R. Unocic, D. Guo, M. B. Okatan, S. Dai, P. T. Cummings, S. V. Kalinin, G. Feng, and N. Balke, Scientific Reports 6 (2016), 32389
[5]. A. Yulaev, H. Guo, E. Strelcov, L. Chen, I. Vlassiouk, A Kolmakov, ACS applied materials & interfaces 9 (2017), 26492-26502
[6]. H. Guo, E. Strelcov, A. Yulaev, J. Wang, N. Appathurai, S. Urquhart, J. Vinson, S. Sahu, M. Zwolak, and A. Kolmakov, Nano Letters,17(2017), 1034–1041