| AVS 63rd International Symposium & Exhibition | |
| Manufacturing Science and Technology | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | MS-TuA1 Southeastern Nanotechnology Infrastructure Corridor (SENIC) – A Nano Fabrication and Characterization Resource as part of the National Nanotechnology Coordinated Infrastructure (NNCI) Paul Joseph, D. Gottfried, G. Spinner, O. Brand, Georgia Institute of Technology |
| 2:40pm | MS-TuA2 The Cornell NanoScale Science and Technology Facility (CNF) Michael Skvarla, Cornell NanoScale Science and Technology Facility |
| 3:00pm | MS-TuA3 The CNST NanoFab at NIST: Nanofabrication for US Commerce Vincent Luciani, NIST Center for Nanoscale Science and Technology |
| 3:20pm | MS-TuA4 In-Situ Characterization Tools for Materials Growth and Processing at NSLS-II Klaus Attenkofer, E. Stavitski, K. Evans-Lutterodt, C. Nelson, Brookhaven National Laboratory |
| 4:20pm | MS-TuA7 The Center for Nanophase Materials Sciences Michael Simpson, Oak Ridge National Laboratory |
| 4:40pm | MS-TuA8 User Opportunities at the Center for Nanoscale Materials Kathleen Carrado Gregar, Center for Nanoscale Materials at Argonne National Laboratory |
| 5:00pm | MS-TuA9 The Center for Integrated Nanotechnologies--Resources and Capabilities Dale Huber, Sandia National Laboratories |
| 5:20pm | MS-TuA10 Using EMSL Capabilities in Combination with those from other User Facilities to Address Fundamental and Applied Problems Donald Baer, M.H. Engelhard, T.J. Law, Pacific Northwest National Laboratory |