AVS 63rd International Symposium & Exhibition
    Advanced Ion Microscopy Focus Topic Thursday Sessions

Session HI+NS-ThM
Fundamentals of Ion Beam Microscopy

Thursday, November 10, 2016, 8:00 am, Room 104A
Moderators: Armin Gölzhäuser, Bielefeld University, Germany, Philip D. Rack, The University of Tennessee Knoxville


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:00am HI+NS-ThM1
Generation of Hydrogen Beams using Single Atom and Trimer Nanotips
Radovan Urban, University of Alberta and The National Institute for Nanotechnology, Canada, K. Nova, University of Alberta, Canada, M. Salomons, National Institute for Nanotechnology, Canada, R.A. Wolkow, University of Alberta and The National Institute for Nanotechnology, Canada, J.L. Pitters, National Institute for Nanotechnology, Canada
8:20am HI+NS-ThM2
High-brightness Xenon Gas Field Ion Source from a Single-Atom Tip
Ing-Shouh Hwang, Institute of Physics, Academia Sinica, Taipei, Taiwan, Taiwan, Republic of China, W.T. Chang, W.C. Lai, P.-C. Li, Institute of Physics, Academia Sinica, Taipei, Taiwan, T.Y. Fu, Department of Physics, National Taiwan Normal University, Taipei, Taiwan, T.T. Tsong, Institute of Physics, Academia Sinica, Taipei, Taiwan
8:40am HI+NS-ThM3 Invited Paper
New Ion Source for Nanofabrication and Microscopy
Adam Steele, B. Knuffman, A. Schwarzkopf, zeroK NanoTech Corporation, J.J. McClelland, National Institute of Standards and Technology (NIST)
9:20am HI+NS-ThM5 Invited Paper
Recent Liquid Metal Ion Source developments for Improving Focused Ion Beam Machines
Jacques Gierak, LPN-CNRS, Route de Nozay France, L. Bischoff, Helmholtz-Zentrum Dresden-Rossendorf, Institute of Ion Beam Physics and Materials Research, Germany, P. Mazarov, L. Bruchhaus, Raith GmbH, Germany, P. Lozano, C. Perez Martinez, Massachusetts Institute of Technology
11:00am HI+NS-ThM10
Elucidating the Directed Nanoscale Transformations when Building with Ions in Liquid
A. Ievlev, V. Iberi, J. Jakowski, M.J. Burch, H. Hysmith, A. Belianinov, R.R. Unocic, Olga Ovchinnikova, Oak Ridge National Laboratory
11:20am HI+NS-ThM11
Determination of an Upper Limit of Ionization Probability during SIMS Experiments using Laser Post-ionization
Nicholas Popczun, L. Breuer, Pennsylvania State University, A. Wucher, University of Duisburg-Essen, Germany, N. Winograd, Pennsylvania State University
11:40am HI+NS-ThM12
Studying Gas Cluster Ion Beam Sputter Yields and Surface Topography in the Helium Ion Microscope
Anders Barlow, N. Sano, J.F. Portoles, P.J. Cumpson, Newcastle University, UK