| AVS 63rd International Symposium & Exhibition | |
| Exhibitor Technology Spotlight | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 12:40pm | EW-TuL2 Spin-resolved Momentum Microscopy Thomas Stempel Pereira, SPECS Surface Nano Analysis GmbH |
| 1:00pm | EW-TuL3 The New Generation of the Hemispherical Energy Analyser in the Novel Surface Science Research Lukasz Walczak, PREVAC Sp z o.o., Rogow, Poland |
| 1:20pm | EW-TuL4 Latest Developments in XPS and Related Methods from Kratos Analytical Chris Blomfield, J.D.P. Counsell, S.J. Coultas, S.C. Page, Kratos Analytical Limited, UK, C. Moffitt, Kratos Analytical Limited |
| 1:40pm | EW-TuL5 What's New with Physical Electronics John Newman, Physical Electronics USA |