Paper EW-TuL2
Spin-resolved Momentum Microscopy
Tuesday, November 8, 2016, 12:40 pm, Room Hall C
We present a newly developed lens design which provides a full 2π solid acceptance angle with highest angular, energy and lateral resolution. In contrast to standard electron analyzers, electronic structure data from and beyond the 1st Brillouin zone is recorded without any sample movement. In addition the lens can work in a lateral imaging mode for microscopy as well. This enables navigation on the sample and reduces the size of the area under investigation down to a few micrometers in diameter. We have combined this lens design with two different kinds of energy dispersive elements: a time-of-flight section or a hemisphere. Both versions combine large acceptance angle, high angular resolution and small acceptance area, making these instruments the ideal tools for electronic structure studies on small samples or sample areas. The functionality of these instruments can be further enhanced by replacing the standard 2D-DLD detector with a spin-resolving imaging detector. The spin-resolved imaging is achieved by electron reflection at a W(100) spin-filter in the [010] azimuth at 45° reflection angle crystal prior to the 2D detector. Varying the scattering energy one can choose positive, negative, or vanishing reflection asymmetry.