AVS 63rd International Symposium & Exhibition
    Electronic Materials and Photonics Thursday Sessions

Session EM+AC+SS+TF-ThM
Radiation Detection Materials and Devices

Thursday, November 10, 2016, 8:00 am, Room 102A
Moderators: Sean King, Intel Corporation, Michelle Paquette, University of Missouri-Kansas City


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:00am EM+AC+SS+TF-ThM1 Invited Paper
Novel High Energy Resolution Scintillator Detectors
Arnold Burger, E. Rowe, L. Matei, P. Bhattacharya, M. Groza, Fisk University, K. Stassun, Vanderbilt University, A. Stowe, Consolidated Nuclear Security Y-12, N. Cherepy, S. Payne, Lawrence Livermore National Laboratory
8:40am EM+AC+SS+TF-ThM3
Improved p–n Heterojunction Device Performance Induced by Irradiation in Amorphous Boron Carbide Films
George Peterson, Q. Su, University of Nebraska - Lincoln, Y. Wang, Los Alamos National Laboratory, P.A. Dowben, M. Nastasi, University of Nebraska - Lincoln
9:00am EM+AC+SS+TF-ThM4
Amorphous Hydrogenated Boron Carbide for Direct-Conversion Solid-State Neutron Detection
Gyanendra Bhattarai, T.D. Nguyen, S. Dhungana, A.N. Caruso, M.M. Paquette, University of Missouri-Kansas City
9:20am EM+AC+SS+TF-ThM5
Radiation Damage of Low-κ Interlayer Dielectrics Studied with Electrically Detected Magnetic Resonance
Michael Mutch, P.M. Lenahan, Pennsylvania State University, S.W. King, Intel Corporation
9:40am EM+AC+SS+TF-ThM6
Modeling Unit Displacement Damage in Amorphous Silicon Oxycarbides
Hepeng Ding, M. Demkowicz, MIT
11:00am EM+AC+SS+TF-ThM10 Invited Paper
Position-Sensitive 3D CZT Gamma-Ray Detectors with Thickness Up to 50 mm
Ralph James, A.E. Bolotnikov, G.S. Camarda, Y. Cui, G. De Geronimo, J. Fried, A. Hossain, G. Mahler, U. Roy, E. Vernon, G. Yang, Brookhaven National Laboratory
11:40am EM+AC+SS+TF-ThM12
Understanding the Electrical Properties of U3O8 for Direct Conversion Neutron Detectors
Brandon Shaver, S. Lawson, B. Musicó, The University of Tennessee Knoxville, S. Dhungana, G. Bhattarai, M.M. Paquette, A.N. Caruso, University of Missouri-Kansas City, T. Meek, The University of Tennessee Knoxville
12:00pm EM+AC+SS+TF-ThM13
Radiation Damage in 4H SiC nMOSFETs Detected by Electrically Detected Magnetic Resonance
Ryan Waskiewicz, M.A. Anders, P.M. Lenahan, Pennsylvania State University, A.J. Lelis, U.S. Army Research Laboratory