| AVS 63rd International Symposium & Exhibition | |
| Applied Surface Science | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS-MoM1 Invited Paper Quantitative Analysis of Dendrimer-Encapsulated Nanoparticles P. Bhattacharya, University of Dayton Research Institute, M.H. Engelhard, L. Kovarik, L. Estevez, Pacific Northwest National Laboratory, Y.-C. Wang, University of Washington, D.R. Baer, Pacific Northwest National Laboratory, D.G. Castner, University of Washington, Daniel Gaspar, Pacific Northwest National Laboratory |
| 9:00am | AS-MoM3 Developing a Straightforward Method to Calculate Shell Thicknesses for Core-Shell-Shell Nanoparticles from XPS Data David Cant, National Physical Laboratory, UK, Y.C. Wang, D.G. Castner, University of Washington, A.G. Shard, National Physical Laboratory, UK |
| 9:20am | AS-MoM4 Double-Lorentzian Asymmetric Line-shape as a Practical Tool for Peak-fitting Multiplet Structures in XPS Data Alberto Herrera-Gomez, D. Cabrera-German, CINVESTAV-Queretaro, Mexico, J.A. Huerta-Ruelas, CICATA-Unidad Queretaro, Mexico, M. Bravo-Sanchez, IPICYT, Mexico |
| 9:40am | AS-MoM5 Quantitative Evaluation of the Carbon Hybridization State by Near Edge X-Ray Absorption Fine Structure Spectroscopy Filippo Mangolini, University of Leeds, United Kingdom of Great Britain and Northern Ireland, J.B. McClimon, R.W. Carpick, University of Pennsylvania |
| 10:00am | AS-MoM6 Simultaneous XPS-UPS Depth Profiling of Thin Films Jon Treacy, C. Deeks, P. Mack, T.S. Nunney, Thermo Fisher Scientific, UK |
| 11:00am | AS-MoM9 Quantification of the Layer Thickness of Thin Organic Layers by Secondary Ion Mass Spectrometry Depth Profiling M.P. Seah, Rasmus Havelund, I.S. Gilmore, National Physical Laboratory, UK |
| 11:20am | AS-MoM10 Spectromicroscopy and Vector Analysis of Carbon Materials Adam Roberts, Kratos Analytical Limited, UK, N. Fairley, Casa Software Ltd, UK, J.D.P. Counsell, C.J. Blomfield, Kratos Analytical Limited, UK |
| 11:40am | AS-MoM11 Angular Broadening in Core Electron Spectroscopy H. Cohen, Weizmann Institute of Science, Israel, Alon Givon, Tel Aviv University, Israel |