AVS 63rd International Symposium & Exhibition
    Applied Surface Science Monday Sessions
       Session AS-MoM

Paper AS-MoM11
Angular Broadening in Core Electron Spectroscopy

Monday, November 7, 2016, 11:40 am, Room 101B

Session: Quantitative Surface Analysis: New Ways to Perform Old Tricks
Presenter: Alon Givon, Tel Aviv University, Israel
Authors: H. Cohen, Weizmann Institute of Science, Israel
A. Givon, Tel Aviv University, Israel
Correspondent: Click to Email
Using an analytic approach, the role of angular broadening in quantitative core-electron spectroscopy is investigated. It is shown why, practically, the broadening effect remains relatively small for a broad range of parameters, including detection angular openings of nearly +- 30 degrees. Based on the analytic expression, a correction factor can be derived, suggesting that the replacement of inelastic-mean-free-path by an effective attenuation-length parameter is not necessarily an optimal choice. The derived expression further proposes useful insight on the contribution of leading experimental parameters and, in particular, on the sharp increase of elastic-scattering corrections above a (depth dependent) critical angle.