| AVS 63rd International Symposium & Exhibition | |
| Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | AS+SS-TuA1 Fast Strain Mapping of Nanowire Light-Emitting Diodes Using Nanofocused X-ray Beams T. Stankevic, Copenhagen University, Denmark, U. Johansson, L. Samuelson, Lund University, Sweden, G. Falkenberg, DESY, Hamburg, Germany, R. Feidenhans’l, Copenhagen University, Denmark, Anders Mikkelsen, Lund University, Sweden |
| 2:40pm | AS+SS-TuA2 Bellerophon Environment for Analysis of Materials (BEAM), A High Performance Computing Workflow Platform for Materials Research E.J. Lingerfelt, A. Belianinov, E. Endeve, Oak Ridge National Laboratory, O.S. Ovchinnikov, Vanderbilt University, S. Somnath, R.K. Archiblad, S.V. Kalinin, Stephen Jesse, Oak Ridge National Laboratory |
| 3:00pm | AS+SS-TuA3 Invited Paper The Center for Advanced Methods for Energy Research Applications (CAMERA):Mathematical Methods for Data Science from Experimental Facilities James Sethian, University of California at Berkeley |
| 4:20pm | AS+SS-TuA7 New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE) Matthew Linford, B. Singh, J. Bagley, Brigham Young University, J. Terry, Illinois Institute of Technology, A. Herrera-Gomez, CINVESTAV-Unidad, Mexico |
| 4:40pm | AS+SS-TuA8 A Surface Investigation of Parchments using ToF-SIMS and Principle Component Analysis Marie-Laure Abel, J.F. Watts, V. Vilde, University of Surrey, UK |
| 5:00pm | AS+SS-TuA9 Invited Paper Multivariate Analysis of Very Large Hyperspectral SIMS Datasets: What Can We Do, and What Would We Like to Do? Henrik Arlinghaus, ION-TOF GmbH, Germany |
| 5:40pm | AS+SS-TuA11 High mass-resolution 3D ToF-SIMS: PCA and visualization in seconds using Graphical Processor Units (GPUs) Peter Cumpson, I.W. Fletcher, N. Sano, A.J. Barlow, Newcastle University, UK |
| 6:00pm | AS+SS-TuA12 Mass Spectrometry Image Fusion Bonnie June Tyler, Universität Münster, Germany, H.F. Arlinghaus, University of Muenster, Germany |